Test integration of core-based system-on-chip supporting delay test

S.-M. Wang, C.-Y. Lo, C.-H. Wang, Cheng-Wen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication16th VLSI Design/CAD Symposium
Place of PublicationHualien
Publication statusPublished - 2005 Aug

Cite this