Test Scheduling of BISTed Memory Cores for SOC

Cheng-Wen Wu, C.-W. Wang Wang, J.-R. Huang, Y.-F. Lin, K.-L. Cheng, C.-T. Huang, Y.-L. Lin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

19 Citations (Scopus)
Original languageEnglish
Title of host publication11th IEEE Asian Test Symposium
Place of PublicationGuam
Publication statusPublished - 2002 Nov

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