Test wrapper design automation for system-on-chip

Cheng-Wen Wu, H.-J. Huang, J.-F. Li, J.-B. Chen, C.-P. Su, C.-W. Wu, C. Cheng, S.-I Chen, C.-Y. Hwang, H.-P. Lin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication12th VLSI Design/CAD Symposium
Place of PublicationHsinchu
Publication statusPublished - 2001 Aug

Cite this

Wu, C-W., Huang, H-J., Li, J-F., Chen, J-B., Su, C-P., Wu, C-W., Cheng, C., Chen, S. -I., Hwang, C-Y., & Lin, H-P. (2001). Test wrapper design automation for system-on-chip. In 12th VLSI Design/CAD Symposium