Testing and diagnosing embedded content addressable memories

Jin Fu Li; Ruey Shing Tzeng; Cheng Wen Wu

doi:10.1109/VTS.2002.1011169

Testing and diagnosing embedded content addressable memories

Jin Fu Li, Ruey Shing Tzeng, Cheng Wen Wu

Department of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

7 Citations (Scopus)

Abstract

Embedded content addressable memories (CAMs) are important components in many system chips. In this paper two efficient March-like test algorithms are proposed. In addition to typical RAM faults, they also cover CAM-specific comparison faults. The first algorithm requires 9N Read/Write operations and 2(N+W) Compare operations to cover comparison and RAM faults (but does not fully cover the intra-word coupling faults), for an N×W-bit CAM. The second algorithm uses 3N log₂ W Write and 2W log₂ W Compare operations to cover the remaining intra-word coupling faults. Compared with the previous algorithms, the proposed algorithms have higher fault coverage and lower time complexity. Moreover it can test the CAM even when its comparison result is observed only by the Hit output or the priority encoder output. Fault-location algorithms are also developed for locating the cells with comparison faults.

Original language	English
Title of host publication	Proceedings - 20th IEEE VLSI Test Symposium, VTS 2002
Publisher	IEEE Computer Society
Pages	389-394
Number of pages	6
ISBN (Electronic)	0769515703
DOIs	https://doi.org/10.1109/VTS.2002.1011169
Publication status	Published - 2002 Jan 1
Event	20th IEEE VLSI Test Symposium, VTS 2002 - Monterey, United States Duration: 2002 Apr 28 → 2002 May 2

Publication series

Name	Proceedings of the IEEE VLSI Test Symposium
Volume	2002-January

Conference

Conference	20th IEEE VLSI Test Symposium, VTS 2002
Country/Territory	United States
City	Monterey
Period	02-04-28 → 02-05-02

All Science Journal Classification (ASJC) codes

Computer Science Applications
Electrical and Electronic Engineering

Access to Document

10.1109/VTS.2002.1011169

Cite this

@inproceedings{e72cffd8e3c74fca90ba60c2a955a9d0,

title = "Testing and diagnosing embedded content addressable memories",

abstract = "Embedded content addressable memories (CAMs) are important components in many system chips. In this paper two efficient March-like test algorithms are proposed. In addition to typical RAM faults, they also cover CAM-specific comparison faults. The first algorithm requires 9N Read/Write operations and 2(N+W) Compare operations to cover comparison and RAM faults (but does not fully cover the intra-word coupling faults), for an N×W-bit CAM. The second algorithm uses 3N log2 W Write and 2W log2 W Compare operations to cover the remaining intra-word coupling faults. Compared with the previous algorithms, the proposed algorithms have higher fault coverage and lower time complexity. Moreover it can test the CAM even when its comparison result is observed only by the Hit output or the priority encoder output. Fault-location algorithms are also developed for locating the cells with comparison faults.",

author = "Li, {Jin Fu} and Tzeng, {Ruey Shing} and Wu, {Cheng Wen}",

note = "Publisher Copyright: {\textcopyright} 2002 IEEE.; 20th IEEE VLSI Test Symposium, VTS 2002 ; Conference date: 28-04-2002 Through 02-05-2002",

year = "2002",

month = jan,

day = "1",

doi = "10.1109/VTS.2002.1011169",

language = "English",

series = "Proceedings of the IEEE VLSI Test Symposium",

publisher = "IEEE Computer Society",

pages = "389--394",

booktitle = "Proceedings - 20th IEEE VLSI Test Symposium, VTS 2002",

address = "United States",

}

Li, JF, Tzeng, RS & Wu, CW 2002, Testing and diagnosing embedded content addressable memories. in Proceedings - 20th IEEE VLSI Test Symposium, VTS 2002., 1011169, Proceedings of the IEEE VLSI Test Symposium, vol. 2002-January, IEEE Computer Society, pp. 389-394, 20th IEEE VLSI Test Symposium, VTS 2002, Monterey, United States, 02-04-28. https://doi.org/10.1109/VTS.2002.1011169

TY - GEN

T1 - Testing and diagnosing embedded content addressable memories

AU - Li, Jin Fu

AU - Tzeng, Ruey Shing

AU - Wu, Cheng Wen

PY - 2002/1/1

Y1 - 2002/1/1

N2 - Embedded content addressable memories (CAMs) are important components in many system chips. In this paper two efficient March-like test algorithms are proposed. In addition to typical RAM faults, they also cover CAM-specific comparison faults. The first algorithm requires 9N Read/Write operations and 2(N+W) Compare operations to cover comparison and RAM faults (but does not fully cover the intra-word coupling faults), for an N×W-bit CAM. The second algorithm uses 3N log2 W Write and 2W log2 W Compare operations to cover the remaining intra-word coupling faults. Compared with the previous algorithms, the proposed algorithms have higher fault coverage and lower time complexity. Moreover it can test the CAM even when its comparison result is observed only by the Hit output or the priority encoder output. Fault-location algorithms are also developed for locating the cells with comparison faults.

AB - Embedded content addressable memories (CAMs) are important components in many system chips. In this paper two efficient March-like test algorithms are proposed. In addition to typical RAM faults, they also cover CAM-specific comparison faults. The first algorithm requires 9N Read/Write operations and 2(N+W) Compare operations to cover comparison and RAM faults (but does not fully cover the intra-word coupling faults), for an N×W-bit CAM. The second algorithm uses 3N log2 W Write and 2W log2 W Compare operations to cover the remaining intra-word coupling faults. Compared with the previous algorithms, the proposed algorithms have higher fault coverage and lower time complexity. Moreover it can test the CAM even when its comparison result is observed only by the Hit output or the priority encoder output. Fault-location algorithms are also developed for locating the cells with comparison faults.

UR - http://www.scopus.com/inward/record.url?scp=1642388110&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=1642388110&partnerID=8YFLogxK

U2 - 10.1109/VTS.2002.1011169

DO - 10.1109/VTS.2002.1011169

M3 - Conference contribution

AN - SCOPUS:1642388110

T3 - Proceedings of the IEEE VLSI Test Symposium

SP - 389

EP - 394

BT - Proceedings - 20th IEEE VLSI Test Symposium, VTS 2002

PB - IEEE Computer Society

T2 - 20th IEEE VLSI Test Symposium, VTS 2002

Y2 - 28 April 2002 through 2 May 2002

ER -

Testing and diagnosing embedded content addressable memories

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