Testing and diagnosing embedded content addressable memories

Jin Fu Li, Ruey Shing Tzeng, Cheng Wen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)


Embedded content addressable memories (CAMs) are important components in many system chips. In this paper two efficient March-like test algorithms are proposed. In addition to typical RAM faults, they also cover CAM-specific comparison faults. The first algorithm requires 9N Read/Write operations and 2(N+W) Compare operations to cover comparison and RAM faults (but does not fully cover the intra-word coupling faults), for an N×W-bit CAM. The second algorithm uses 3N log2 W Write and 2W log2 W Compare operations to cover the remaining intra-word coupling faults. Compared with the previous algorithms, the proposed algorithms have higher fault coverage and lower time complexity. Moreover it can test the CAM even when its comparison result is observed only by the Hit output or the priority encoder output. Fault-location algorithms are also developed for locating the cells with comparison faults.

Original languageEnglish
Title of host publicationProceedings - 20th IEEE VLSI Test Symposium, VTS 2002
PublisherIEEE Computer Society
Number of pages6
ISBN (Electronic)0769515703
Publication statusPublished - 2002 Jan 1
Event20th IEEE VLSI Test Symposium, VTS 2002 - Monterey, United States
Duration: 2002 Apr 282002 May 2

Publication series

NameProceedings of the IEEE VLSI Test Symposium


Conference20th IEEE VLSI Test Symposium, VTS 2002
CountryUnited States

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Electrical and Electronic Engineering

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