Testing Content-Addressable Memories Using Functional Fault Models and March-Like Algorithms

Cheng-Wen Wu, K.-J. Lin

Research output: Contribution to journalArticle

32 Citations (Scopus)
Original languageEnglish
Pages (from-to)577-588
JournalIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume19
Issue number5
Publication statusPublished - 2000 May

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