Testing embedded memories: Is BIST the ultimate solution?

Research output: Chapter in Book/Report/Conference proceedingConference contribution

13 Citations (Scopus)

Abstract

The trend that embedded memories will play an important role in the semiconductor market over the next few years has been widely noted. The testing of embedded memories therefore is becoming an industry-wide concern. This panel will try to clarify some important issues regarding embedded memory testing, such as the use of BIST for various testing purposes, the use of IddQ for reliability screening, the possibility of built-in redundancy analysis and self-repair, etc.

Original languageEnglish
Title of host publicationProceedings of the Asian Test Symposium
Pages516-517
Number of pages2
DOIs
Publication statusPublished - 1998 Dec 1
EventProceedings of the 1998 7th Asian Test Symposium - Singapore, Singapore
Duration: 1998 Dec 21998 Dec 4

Publication series

NameProceedings of the Asian Test Symposium
ISSN (Print)1081-7735

Conference

ConferenceProceedings of the 1998 7th Asian Test Symposium
CitySingapore, Singapore
Period98-12-0298-12-04

All Science Journal Classification (ASJC) codes

  • Media Technology
  • Hardware and Architecture

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  • Cite this

    Wu, C. W. (1998). Testing embedded memories: Is BIST the ultimate solution? In Proceedings of the Asian Test Symposium (pp. 516-517). (Proceedings of the Asian Test Symposium). https://doi.org/10.1109/ATS.1998.741668