TY - GEN
T1 - Testing embedded memories
T2 - Proceedings of the 1998 7th Asian Test Symposium
AU - Wu, Cheng Wen
PY - 1998/12/1
Y1 - 1998/12/1
N2 - The trend that embedded memories will play an important role in the semiconductor market over the next few years has been widely noted. The testing of embedded memories therefore is becoming an industry-wide concern. This panel will try to clarify some important issues regarding embedded memory testing, such as the use of BIST for various testing purposes, the use of IddQ for reliability screening, the possibility of built-in redundancy analysis and self-repair, etc.
AB - The trend that embedded memories will play an important role in the semiconductor market over the next few years has been widely noted. The testing of embedded memories therefore is becoming an industry-wide concern. This panel will try to clarify some important issues regarding embedded memory testing, such as the use of BIST for various testing purposes, the use of IddQ for reliability screening, the possibility of built-in redundancy analysis and self-repair, etc.
UR - http://www.scopus.com/inward/record.url?scp=0032291990&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0032291990&partnerID=8YFLogxK
U2 - 10.1109/ATS.1998.741668
DO - 10.1109/ATS.1998.741668
M3 - Conference contribution
AN - SCOPUS:0032291990
SN - 0818682779
T3 - Proceedings of the Asian Test Symposium
SP - 516
EP - 517
BT - Proceedings of the Asian Test Symposium
Y2 - 2 December 1998 through 4 December 1998
ER -