Original language | English |
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Title of host publication | 3rd VLSI Test Technology Workshop (VTTW) |
Place of Publication | Nantou |
Publication status | Published - 2009 Jul |
Testing for 3D FPGA interconnect open and short faults
Cheng-Wen Wu, Y.-L. Peng
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution