| Original language | English |
|---|---|
| Title of host publication | 3rd VLSI Test Technology Workshop (VTTW) |
| Place of Publication | Nantou |
| Publication status | Published - 2009 Jul |
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Testing for 3D FPGA interconnect open and short faults
- Cheng-Wen Wu
- , Y.-L. Peng
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution