Testing Iterative Logic Arrays for Sequential Faults with a Constant Number of Patterns

Chih Yuang Su, Cheng Wen Wu

Research output: Contribution to journalArticle

25 Citations (Scopus)

Abstract

We show that a constant number of test vectors are sufficient for fully testing a k-dimensional ILA for sequential faults if the cell function is bijective. We then present an efficient algorithm to obtain such a test sequence. By extending the concept of C-testability and M-testability to sequential faults, the constant-length test sequence can be obtained. A pipelined array multiplier is shown to be C-testable with only 53 test vectors for exhaustively testing the sequential faults.

Original languageEnglish
Pages (from-to)495-501
Number of pages7
JournalIEEE Transactions on Computers
Volume43
Issue number4
DOIs
Publication statusPublished - 1994 Jan 1

Fingerprint

Fault
Logic
Testing
Bijective
Multiplier
Efficient Algorithms
Sufficient
Cell

All Science Journal Classification (ASJC) codes

  • Software
  • Theoretical Computer Science
  • Hardware and Architecture
  • Computational Theory and Mathematics

Cite this

@article{dd4fbeecd3a14f64859b6f8821c0843c,
title = "Testing Iterative Logic Arrays for Sequential Faults with a Constant Number of Patterns",
abstract = "We show that a constant number of test vectors are sufficient for fully testing a k-dimensional ILA for sequential faults if the cell function is bijective. We then present an efficient algorithm to obtain such a test sequence. By extending the concept of C-testability and M-testability to sequential faults, the constant-length test sequence can be obtained. A pipelined array multiplier is shown to be C-testable with only 53 test vectors for exhaustively testing the sequential faults.",
author = "Su, {Chih Yuang} and Wu, {Cheng Wen}",
year = "1994",
month = "1",
day = "1",
doi = "10.1109/12.278489",
language = "English",
volume = "43",
pages = "495--501",
journal = "IEEE Transactions on Computers",
issn = "0018-9340",
publisher = "IEEE Computer Society",
number = "4",

}

Testing Iterative Logic Arrays for Sequential Faults with a Constant Number of Patterns. / Su, Chih Yuang; Wu, Cheng Wen.

In: IEEE Transactions on Computers, Vol. 43, No. 4, 01.01.1994, p. 495-501.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Testing Iterative Logic Arrays for Sequential Faults with a Constant Number of Patterns

AU - Su, Chih Yuang

AU - Wu, Cheng Wen

PY - 1994/1/1

Y1 - 1994/1/1

N2 - We show that a constant number of test vectors are sufficient for fully testing a k-dimensional ILA for sequential faults if the cell function is bijective. We then present an efficient algorithm to obtain such a test sequence. By extending the concept of C-testability and M-testability to sequential faults, the constant-length test sequence can be obtained. A pipelined array multiplier is shown to be C-testable with only 53 test vectors for exhaustively testing the sequential faults.

AB - We show that a constant number of test vectors are sufficient for fully testing a k-dimensional ILA for sequential faults if the cell function is bijective. We then present an efficient algorithm to obtain such a test sequence. By extending the concept of C-testability and M-testability to sequential faults, the constant-length test sequence can be obtained. A pipelined array multiplier is shown to be C-testable with only 53 test vectors for exhaustively testing the sequential faults.

UR - http://www.scopus.com/inward/record.url?scp=0028416946&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0028416946&partnerID=8YFLogxK

U2 - 10.1109/12.278489

DO - 10.1109/12.278489

M3 - Article

AN - SCOPUS:0028416946

VL - 43

SP - 495

EP - 501

JO - IEEE Transactions on Computers

JF - IEEE Transactions on Computers

SN - 0018-9340

IS - 4

ER -