Abstract
We show that a constant number of test vectors are sufficient for fully testing a k-dimensional ILA for sequential faults if the cell function is bijective. We then present an efficient algorithm to obtain such a test sequence. By extending the concept of C-testability and M-testability to sequential faults, the constant-length test sequence can be obtained. A pipelined array multiplier is shown to be C-testable with only 53 test vectors for exhaustively testing the sequential faults.
| Original language | English |
|---|---|
| Pages (from-to) | 495-501 |
| Number of pages | 7 |
| Journal | IEEE Transactions on Computers |
| Volume | 43 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 1994 Jan 1 |
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All Science Journal Classification (ASJC) codes
- Software
- Theoretical Computer Science
- Hardware and Architecture
- Computational Theory and Mathematics
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Testing Iterative Logic Arrays for Sequential Faults with a Constant Number of Patterns. / Su, Chih Yuang; Wu, Cheng Wen.
In: IEEE Transactions on Computers, Vol. 43, No. 4, 01.01.1994, p. 495-501.Research output: Contribution to journal › Article
TY - JOUR
T1 - Testing Iterative Logic Arrays for Sequential Faults with a Constant Number of Patterns
AU - Su, Chih Yuang
AU - Wu, Cheng Wen
PY - 1994/1/1
Y1 - 1994/1/1
N2 - We show that a constant number of test vectors are sufficient for fully testing a k-dimensional ILA for sequential faults if the cell function is bijective. We then present an efficient algorithm to obtain such a test sequence. By extending the concept of C-testability and M-testability to sequential faults, the constant-length test sequence can be obtained. A pipelined array multiplier is shown to be C-testable with only 53 test vectors for exhaustively testing the sequential faults.
AB - We show that a constant number of test vectors are sufficient for fully testing a k-dimensional ILA for sequential faults if the cell function is bijective. We then present an efficient algorithm to obtain such a test sequence. By extending the concept of C-testability and M-testability to sequential faults, the constant-length test sequence can be obtained. A pipelined array multiplier is shown to be C-testable with only 53 test vectors for exhaustively testing the sequential faults.
UR - http://www.scopus.com/inward/record.url?scp=0028416946&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0028416946&partnerID=8YFLogxK
U2 - 10.1109/12.278489
DO - 10.1109/12.278489
M3 - Article
AN - SCOPUS:0028416946
VL - 43
SP - 495
EP - 501
JO - IEEE Transactions on Computers
JF - IEEE Transactions on Computers
SN - 0018-9340
IS - 4
ER -