Testing Iterative Logic Arrays for Sequential Faults with a Constant Number of Patterns

Chih Yuang Su, Cheng Wen Wu

Research output: Contribution to journalArticle

25 Citations (Scopus)

Abstract

We show that a constant number of test vectors are sufficient for fully testing a k-dimensional ILA for sequential faults if the cell function is bijective. We then present an efficient algorithm to obtain such a test sequence. By extending the concept of C-testability and M-testability to sequential faults, the constant-length test sequence can be obtained. A pipelined array multiplier is shown to be C-testable with only 53 test vectors for exhaustively testing the sequential faults.

Original languageEnglish
Pages (from-to)495-501
Number of pages7
JournalIEEE Transactions on Computers
Volume43
Issue number4
DOIs
Publication statusPublished - 1994 Jan 1

All Science Journal Classification (ASJC) codes

  • Software
  • Theoretical Computer Science
  • Hardware and Architecture
  • Computational Theory and Mathematics

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