Testing Iterative Logic Arrays for Sequential Faults with a Constant Number of Patterns

Chih Yuang Su; Cheng Wen Wu

doi:10.1109/12.278489

Testing Iterative Logic Arrays for Sequential Faults with a Constant Number of Patterns

Chih Yuang Su, Cheng Wen Wu

Department of Electrical Engineering

Research output: Contribution to journal › Article

25 Citations (Scopus)

Abstract

We show that a constant number of test vectors are sufficient for fully testing a k-dimensional ILA for sequential faults if the cell function is bijective. We then present an efficient algorithm to obtain such a test sequence. By extending the concept of C-testability and M-testability to sequential faults, the constant-length test sequence can be obtained. A pipelined array multiplier is shown to be C-testable with only 53 test vectors for exhaustively testing the sequential faults.

Original language	English
Pages (from-to)	495-501
Number of pages	7
Journal	IEEE Transactions on Computers
Volume	43
Issue number	4
DOIs	https://doi.org/10.1109/12.278489
Publication status	Published - 1994 Jan 1

All Science Journal Classification (ASJC) codes

Software
Theoretical Computer Science
Hardware and Architecture
Computational Theory and Mathematics

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Su, C. Y., & Wu, C. W. (1994). Testing Iterative Logic Arrays for Sequential Faults with a Constant Number of Patterns. IEEE Transactions on Computers, 43(4), 495-501. https://doi.org/10.1109/12.278489

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