@article{dd4fbeecd3a14f64859b6f8821c0843c,
title = "Testing Iterative Logic Arrays for Sequential Faults with a Constant Number of Patterns",
abstract = "We show that a constant number of test vectors are sufficient for fully testing a k-dimensional ILA for sequential faults if the cell function is bijective. We then present an efficient algorithm to obtain such a test sequence. By extending the concept of C-testability and M-testability to sequential faults, the constant-length test sequence can be obtained. A pipelined array multiplier is shown to be C-testable with only 53 test vectors for exhaustively testing the sequential faults.",
author = "Su, {Chih Yuang} and Wu, {Cheng Wen}",
note = "Funding Information: I. INTRODUCTION With the rapid progress of VLSI technology and the increasing quest of high-speed digital signal processing hardware, iterative logic arrays (ILA{\textquoteright}s) are becoming more and more popular due to their superiority in computational performance and ease of design and testing. Kautz investigated the testing of one-and two-dimensional ILA{\textquoteright}s [l]. He characterized the necessary and sufficient conditions for exhaustively testing all cells in an ILA. The concept of C-testability was first proposed by Friedman [2]. He showed that certain one-dimensional ILA{\textquoteright}s can be fully tested by using a constant number of test patterns, i.e., the number of test patterns needed is independent of the size of the array. Parthasarathy and Reddy Manuscript received July 2, 1991; revised December 4, 1991, and July 6, 1992. This work was supported in part by the National Science Council, R.O.C., under Contracts NSC80-0404-E007-33 and NSC81-0404-E007-118. The authors are with the Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan 30043, ROC. IEEE Log Number 9209030.",
year = "1994",
month = jan,
day = "1",
doi = "10.1109/12.278489",
language = "English",
volume = "43",
pages = "495--501",
journal = "IEEE Transactions on Computers",
issn = "0018-9340",
publisher = "IEEE Computer Society",
number = "4",
}