The characterization of N interstitials and dangling bond point defects on ion-implanted GaN nanowires studied by photoluminescence and X-Ray absorption spectroscopy

Kuo Hao Lee, Jau Wern Chiou, Jin Ming Chen, Jyh Fu Lee, Alain Braud, Katharina Lorenz, Eduardo Alves, In Gann Chen

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5 Citations (Scopus)

Abstract

Photoluminescence and X-ray absorption spectroscopy (XAS) measurement were used to characterize the near-band edge (NBE) emission intensity and electronic structure of as-implanted GaN nanowires (NWs) that had been implanted with Eu ions to different fluences. The N K-and Ga L3-edge of total electron yield XAS spectra showed the formation of N interstitials (Ni) and dangling bond (Ndb) point defects and the formation of metallic Ga layers on the surface of NWs. X-ray diffraction, Ga K-and L3-edge of total fluorescence yield XAS spectra consistently revealed the wurtzite structure of the as-implanted NWs up to the highest fluence. The ratio of absorption intensity found in sp3 and sp2 environment and the NBE intensity were strongly affected by the implantation. It is suggested that the decrease of NBE intensity was closely related to the change from sp3 to sp2 environment. The absorption intensity ratio between the as-grown and as-implanted samples of Ndb and N i was directly proportional to the fluences indicating that these defects are preferentially formed during implantation.

Original languageEnglish
Pages (from-to)3531-3534
Number of pages4
JournalJournal of the American Ceramic Society
Volume93
Issue number11
DOIs
Publication statusPublished - 2010 Nov

All Science Journal Classification (ASJC) codes

  • Ceramics and Composites
  • Materials Chemistry

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