The economic models for a VLSI test strategy planning system

C.-C. Wei, Cheng-Wen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationSEMICON Taiwan 97, Test Seminar
Place of PublicationTaipei
Pages87-92
Publication statusPublished - 1997 Sep

Cite this

Wei, C-C., & Wu, C-W. (1997). The economic models for a VLSI test strategy planning system. In SEMICON Taiwan 97, Test Seminar (pp. 87-92).