The economic models for a VLSI test strategy planning system

C.-C. Wei, Cheng-Wen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationSEMICON Taiwan 97, Test Seminar
Place of PublicationTaipei
Pages87-92
Publication statusPublished - 1997 Sept

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