The effect of atomic mass on the physical spatial resolution in EBSD

Delphic Chen, Jui Chao Kuo

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

In this study, bicrystals of silver (Ag) and aluminum (Al) were used to investigate the physical spatial resolution of the electron backscatter diffraction system combining a digital image correlation method. Furthermore, the effect of the accelerating voltage and probe current was investigated on the physical spatial resolution of the lateral and longitudinal resolutions for Ag and Al, respectively. The lateral and longitudinal resolutions show high dependency on the accelerating voltage for a low atomic mass material of Al, In addition, these are almost independent of the accelerating voltage for a high atomic mass material of Ag. Moreover, the probe current does not play any role on both the lateral and longitudinal resolutions. The best lateral resolutions for Al and Ag are 40.5 and 12.1 nm at 10 kV and 1 nA, respectively. The best longitudinal resolutions of 23.2 and 80 nm were obtained at 10 kV and 1 nA for Al and Ag, respectively.

Original languageEnglish
Pages (from-to)4-7
Number of pages4
JournalMicroscopy and Microanalysis
Volume19
Issue numberSUPPL. 5
DOIs
Publication statusPublished - 2013 Aug 1

Fingerprint

atomic weights
spatial resolution
aluminum
Aluminum
Electric potential
electric potential
Bicrystals
bicrystals
Correlation methods
probes
Electron diffraction
Silver
silver
high resolution
diffraction
electrons

All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this

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The effect of atomic mass on the physical spatial resolution in EBSD. / Chen, Delphic; Kuo, Jui Chao.

In: Microscopy and Microanalysis, Vol. 19, No. SUPPL. 5, 01.08.2013, p. 4-7.

Research output: Contribution to journalArticle

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