The effects of ytterbium oxide on the microstructure and R-curve behaviors of silicon nitride

Wen Tse Lo, Jow Lay Huang, Zan Hon Shih, Ding Fwu Lii, Chun Te Li

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)

Abstract

Silicon nitride materials containing various compositions of Yb2O3 were investigated. The effects of sintering additives on the microstructure, fracture and R-curve behaviors were studied. The average grain size and aspect ratio increased with the amount of Yb2O3 additives. The growth of β-grains started growing from pre-existing β-grains (seeding) until impeded by other β-grains. Growth of crystalline phase with planar font was observed inside amorphous pockets. Heterogeneous growth of secondary crystalline phases from two different ends of amorphous pockets was also noticed. The difference in Yb:Si ratio between the amorphous pocket and secondary crystalline phase could inhibit the completion of crystallization. R-curve behaviors were observed in Yb2O3-doped silicon nitride.

Original languageEnglish
Pages (from-to)123-128
Number of pages6
JournalMaterials Chemistry and Physics
Volume73
Issue number2-3
DOIs
Publication statusPublished - 2002 Jan 15

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics

Fingerprint Dive into the research topics of 'The effects of ytterbium oxide on the microstructure and R-curve behaviors of silicon nitride'. Together they form a unique fingerprint.

Cite this