The exchange bias of a permalloy and ordered epitaxial IrMn thin film prepared from the growth of ultrathin [Ir/Mn] multilayer

Chih Hao Lee, Chia Jui Chang, Ming Hong Lee, Yu Chang Lin, J. C.A. Huang

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

The influence of Ir1-xMnx composition and post-annealing on structure and exchange bias of epitaxial Ir 1-xMnx(∼ 10 nm)/Ni80Fe20(7 nm) films were studied. The Ir1-xMnx layer was prepared by MBE growth of [Mn(0.4 nm<X nm<0.7 nm)/Ir(0.2 nm)]N multilayer films. The optimal Hex increases to ∼ 190 Oe after annealing at 533 K for 3 h. X-ray diffraction indicates that the strength of exchange bias is increased with the order parameter of Ir1-xMnx alloy.

Original languageEnglish
Article number6027798
Pages (from-to)3497-3500
Number of pages4
JournalIEEE Transactions on Magnetics
Volume47
Issue number10
DOIs
Publication statusPublished - 2011 Oct

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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