The HOY tester - Can IC testing go wireless?

Cheng Wen Wu; Chih Tsun Huang; Shi Yu Huang; Po Chiun Huang; Tsin Yuan Chang; Yu Tsao Hsing

doi:10.1109/VDAT.2006.258155

The HOY tester - Can IC testing go wireless?

Cheng Wen Wu, Chih Tsun Huang, Shi Yu Huang, Po Chiun Huang, Tsin Yuan Chang, Yu Tsao Hsing

Department of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

22 Citations (Scopus)

Abstract

Test cost is becoming a more and more significant portion of the cost structure in advanced semiconductor products. To address this issue, we propose HOY - a novel wireless test system with enhanced embedded test features. We present the concept, architecture, and test flow for future semiconductor products tested by HOY. Necessary technologies for the success of HOY also are presented, though most of which require further investigation. A preliminary demonstration system has been constructed, and experiments are being conducted.

Original language	English
Title of host publication	2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006 - Proceedings of Technical Papers
Pages	183-186
Number of pages	4
DOIs	https://doi.org/10.1109/VDAT.2006.258155
Publication status	Published - 2007 Oct 1
Event	2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006 - Hsinchu, Taiwan Duration: 2007 Apr 26 → 2007 Apr 28

Publication series

Name	2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006 - Proceedings of Technical Papers

Other

Other	2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006
Country	Taiwan
City	Hsinchu
Period	07-04-26 → 07-04-28

All Science Journal Classification (ASJC) codes

Hardware and Architecture
Electrical and Electronic Engineering

Access to Document

10.1109/VDAT.2006.258155

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Wu, C. W., Huang, C. T., Huang, S. Y., Huang, P. C., Chang, T. Y., & Hsing, Y. T. (2007). The HOY tester - Can IC testing go wireless? In 2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006 - Proceedings of Technical Papers (pp. 183-186). [4027527] (2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006 - Proceedings of Technical Papers). https://doi.org/10.1109/VDAT.2006.258155

Wu, Cheng Wen ; Huang, Chih Tsun ; Huang, Shi Yu ; Huang, Po Chiun ; Chang, Tsin Yuan ; Hsing, Yu Tsao. / The HOY tester - Can IC testing go wireless?. 2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006 - Proceedings of Technical Papers. 2007. pp. 183-186 (2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006 - Proceedings of Technical Papers).

@inproceedings{1f09eb868826498f9014e69ce2c61413,

title = "The HOY tester - Can IC testing go wireless?",

abstract = "Test cost is becoming a more and more significant portion of the cost structure in advanced semiconductor products. To address this issue, we propose HOY - a novel wireless test system with enhanced embedded test features. We present the concept, architecture, and test flow for future semiconductor products tested by HOY. Necessary technologies for the success of HOY also are presented, though most of which require further investigation. A preliminary demonstration system has been constructed, and experiments are being conducted.",

author = "Wu, {Cheng Wen} and Huang, {Chih Tsun} and Huang, {Shi Yu} and Huang, {Po Chiun} and Chang, {Tsin Yuan} and Hsing, {Yu Tsao}",

year = "2007",

month = oct,

day = "1",

doi = "10.1109/VDAT.2006.258155",

language = "English",

isbn = "1424401798",

series = "2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006 - Proceedings of Technical Papers",

pages = "183--186",

booktitle = "2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006 - Proceedings of Technical Papers",

note = "2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006 ; Conference date: 26-04-2007 Through 28-04-2007",

}

Wu, CW, Huang, CT, Huang, SY, Huang, PC, Chang, TY & Hsing, YT 2007, The HOY tester - Can IC testing go wireless? in 2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006 - Proceedings of Technical Papers., 4027527, 2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006 - Proceedings of Technical Papers, pp. 183-186, 2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006, Hsinchu, Taiwan, 07-04-26. https://doi.org/10.1109/VDAT.2006.258155

The HOY tester - Can IC testing go wireless? / Wu, Cheng Wen; Huang, Chih Tsun; Huang, Shi Yu; Huang, Po Chiun; Chang, Tsin Yuan; Hsing, Yu Tsao.

2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006 - Proceedings of Technical Papers. 2007. p. 183-186 4027527 (2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006 - Proceedings of Technical Papers).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution