The HOY tester - Can IC testing go wireless?

Cheng Wen Wu, Chih Tsun Huang, Shi Yu Huang, Po Chiun Huang, Tsin Yuan Chang, Yu Tsao Hsing

Research output: Chapter in Book/Report/Conference proceedingConference contribution

22 Citations (Scopus)

Abstract

Test cost is becoming a more and more significant portion of the cost structure in advanced semiconductor products. To address this issue, we propose HOY - a novel wireless test system with enhanced embedded test features. We present the concept, architecture, and test flow for future semiconductor products tested by HOY. Necessary technologies for the success of HOY also are presented, though most of which require further investigation. A preliminary demonstration system has been constructed, and experiments are being conducted.

Original languageEnglish
Title of host publication2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006 - Proceedings of Technical Papers
Pages183-186
Number of pages4
DOIs
Publication statusPublished - 2007 Oct 1
Event2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006 - Hsinchu, Taiwan
Duration: 2007 Apr 262007 Apr 28

Publication series

Name2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006 - Proceedings of Technical Papers

Other

Other2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006
CountryTaiwan
CityHsinchu
Period07-04-2607-04-28

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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