The Influence of Carbon Content on Material and Field Emission Properties of Nanowires Self-synthesized form Sputter-deposited WCx Films

Shui-Jinn Wang; Rong-Ming Ko; Chao Hsuing Tseng; Wei Chih Tsai; Yi Cheng Kuo; Chia Lung Chang; Zhi Fu Wen

The Influence of Carbon Content on Material and Field Emission Properties of Nanowires Self-synthesized form Sputter-deposited WCx Films

Shui-Jinn Wang, Rong-Ming Ko, Chao Hsuing Tseng, Wei Chih Tsai, Yi Cheng Kuo, Chia Lung Chang, Zhi Fu Wen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	International Conference on Solid State Devices and materials (SSDM'06)
Place of Publication	Yokohama, Japan
Publication status	Published - 2006 Sept 13

Cite this

@inproceedings{0c2085eb28a1496eb49c66a382e5b24a,

title = "The Influence of Carbon Content on Material and Field Emission Properties of Nanowires Self-synthesized form Sputter-deposited WCx Films",

author = "Shui-Jinn Wang and Rong-Ming Ko and Tseng, {Chao Hsuing} and Tsai, {Wei Chih} and Kuo, {Yi Cheng} and Chang, {Chia Lung} and Wen, {Zhi Fu}",

year = "2006",

month = sep,

day = "13",

language = "English",

booktitle = "International Conference on Solid State Devices and materials (SSDM'06)",

}

The Influence of Carbon Content on Material and Field Emission Properties of Nanowires Self-synthesized form Sputter-deposited WCx Films. / Wang, Shui-Jinn; Ko, Rong-Ming; Tseng, Chao Hsuing et al.
International Conference on Solid State Devices and materials (SSDM'06). Yokohama, Japan, 2006.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - The Influence of Carbon Content on Material and Field Emission Properties of Nanowires Self-synthesized form Sputter-deposited WCx Films

AU - Wang, Shui-Jinn

AU - Ko, Rong-Ming

AU - Tseng, Chao Hsuing

AU - Tsai, Wei Chih

AU - Kuo, Yi Cheng

AU - Chang, Chia Lung

AU - Wen, Zhi Fu

PY - 2006/9/13

Y1 - 2006/9/13

M3 - Conference contribution

BT - International Conference on Solid State Devices and materials (SSDM'06)

CY - Yokohama, Japan

ER -