The influences of emotional reactions on learning gains during a computerized self-assessment test

Yueh Min Huang, Chin Fei Huang, Ming Chi Liu, Chang Tzuoh Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This study aims to examine learning gains and emotional reactions by receiving applause during computerized self-assessment testing for elementary school students. The participants were asked to solve mathematics problems in a computer-assisted self-assessment system with or without pre-recorded applause as emotional feedback while EEG measurements were taken. The results of this study provide support for the belief that it is useful to improve students' learning achievement by using emotional reactions such as applause during computer-assisted self-assessment testing, especially for male students. It is suggested that teachers may create such a positive emotional self-assessment learning environment as encourage students to learn by themselves more efficiently.

Original languageEnglish
Title of host publicationAdvanced Technologies, Embedded and Multimedia for Human-Centric Computing, HumanCom and EMC 2013
Pages183-188
Number of pages6
DOIs
Publication statusPublished - 2014 Feb 17
EventAdvanced Technologies, Embedded and Multimedia for Human-Centric Computing, HumanCom and EMC 2013 - , Taiwan
Duration: 2013 Aug 232013 Aug 25

Publication series

NameLecture Notes in Electrical Engineering
Volume260 LNEE
ISSN (Print)1876-1100
ISSN (Electronic)1876-1119

Other

OtherAdvanced Technologies, Embedded and Multimedia for Human-Centric Computing, HumanCom and EMC 2013
CountryTaiwan
Period13-08-2313-08-25

All Science Journal Classification (ASJC) codes

  • Industrial and Manufacturing Engineering

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  • Cite this

    Huang, Y. M., Huang, C. F., Liu, M. C., & Wu, C. T. (2014). The influences of emotional reactions on learning gains during a computerized self-assessment test. In Advanced Technologies, Embedded and Multimedia for Human-Centric Computing, HumanCom and EMC 2013 (pp. 183-188). (Lecture Notes in Electrical Engineering; Vol. 260 LNEE). https://doi.org/10.1007/978-94-007-7262-521