The mechanism and evaluation of hot-carrier-induced performance degradation in 0.18-μm CMOS image sensor

T. H. Hsu, Y. K. Fang, D. N. Yaung, S. G. Wuu, H. C. Chien, C. S. Wang, J. S. Lin, C. H. Tseng, S. F. Chen, C. S. Lin, Yu-Cheng Lin

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Engineering & Materials Science