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The polarized neutron reflectivity and X-ray reflectivity studies of the magnetic profiles of epitaxial Ni80Fe20/Ru multilayers

  • Hui Chia Su
  • , Jinn Jer Peir
  • , Chih Hao Lee
  • , Ming Zhe Lin
  • , Po Tsang Wu
  • , J. C.A. Huang
  • , Zin Tun

Research output: Contribution to journalArticlepeer-review

Abstract

The depth profiles of the epitaxial Ni80Fe20(1 1 1)/Ru(0 0 0 1) multilayers were studied by polarized neutron reflectivity and X-ray reflectivity. At the Ru thickness that the anti-ferromagnetic coupling was found, the magnetic moments between two Ni80Fe20 interlayers show a biquadratic coupling effect with a double unit cell at low applied fields. A magnetic dead layer of about 0.3 nm was also found at the interface boundaries. The maximal polarization effect applied to the Ru layer is less than 0.03μB.

Original languageEnglish
Pages (from-to)80-83
Number of pages4
JournalPhysica B: Condensed Matter
Volume357
Issue number1-2 SPEC. ISS.
DOIs
Publication statusPublished - 2005 Feb 28

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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