The recrystallization of microelectronic lead-free solders

Fei Yi Hung, Truan Sheng Lui, Li Hui Chen, Zhi Feng Gu

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

In Sn-2 mass%Ag-0.5 mass%Cu solder alloy, recrystallization was induced by thermal cycles and the homogenized effect of thermal aging promoted the vibration resistance. Due to the inner stress induced by thermal cycles, the thermal cycle specimen not only possessed a finer structure but also a large number of grain boundaries that were able to increase the vibration life. During vibration, dynamic recrystallization (DRX) was able to occur. In addition. DRX and grain growth had an obvious tendency to increase as the tensile strain rate was increased in the Sn-1 mass%Ag-0.5 mass%Cu solder alloy with a high β-Sn content. Also, high temperatures and plastic deformation had a significant influence on the recrystallization ot the solders.

Original languageEnglish
Pages (from-to)2298-2302
Number of pages5
JournalMaterials Transactions
Volume49
Issue number10
DOIs
Publication statusPublished - 2008 Oct

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Fingerprint Dive into the research topics of 'The recrystallization of microelectronic lead-free solders'. Together they form a unique fingerprint.

Cite this