The use of nanoscaled Al mid-layer for enhancing the electrical conductivity of ZnO

Wan Yu Wu, Chia Kang Lin, Jyh Ming Ting

Research output: Contribution to journalArticle

Abstract

A nanoscaled Al thin film was placed between two ZnO thin films to form a ZnO/Al/ZnO multilayer thin film structure. Individual Al and ZnO thin films with difference thicknesses were first prepared and characterized for the optical and electrical properties. The multilayer structure was then obtained by depositing individual layers with desired thicknesses in sequence. We show that by appropriate selections of layer thickness, the use of a nanoscaled Al mid-layer in ZnO enhances the electrical conductivity of the ZnO without scarifying its optical transmittance.

Original languageEnglish
Pages (from-to)5437-5440
Number of pages4
JournalJournal of Nanoscience and Nanotechnology
Volume10
Issue number8
DOIs
Publication statusPublished - 2010 Aug 1

All Science Journal Classification (ASJC) codes

  • Bioengineering
  • Chemistry(all)
  • Biomedical Engineering
  • Materials Science(all)
  • Condensed Matter Physics

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