Skip to main navigation Skip to search Skip to main content

The use of spatially-dependent carrier capture rates for deep-level-defect transient studies

  • G. P. Li
  • , K. L. Wang

Research output: Contribution to journal › Article › peer-review

13   Link opens in a new tab Citations (Scopus)

Fingerprint

Dive into the research topics of 'The use of spatially-dependent carrier capture rates for deep-level-defect transient studies'. Together they form a unique fingerprint.
Sort by

Engineering

Keyphrases