Theoretical analysis of joint synchronization error effects for OFDMA systems

Wen Long Chin, Sau Gee Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Few papers investigate synchronization error effects for the uplink of orthogonal frequency-division multiple access (OFDMA) systems. By contrast, this paper simultaneously analyzes the joint effects of major synchronization errors, including symbol time (ST) offset (STO), carrier frequency offset (CFO) and sampling clock frequency offset (SCFO) for the uplink of OFDMA systems in time-variant multipath fading channels. Such errors degrade the performance of an OFDMA receiver by introducing inter-carrier interference (ICI), intersymbol interference (ISI) and multiple-access interference (MAI) into the systems. A theoretical signal-to-interference-and-noise ratio (SINR) is formulated to characterize the losses due to synchronization errors in time-variant multipath fading channels. The results provide designers a useful reference in designing suitable synchronization algorithms for the OFDMA applications.

Original languageEnglish
Title of host publication2008 IEEE 67th Vehicular Technology Conference-Spring, VTC
Pages1930-1934
Number of pages5
DOIs
Publication statusPublished - 2008 Jul 28
Event2008 IEEE 67th Vehicular Technology Conference-Spring, VTC - Marina Bay, Singapore
Duration: 2008 May 112008 May 14

Publication series

NameIEEE Vehicular Technology Conference
ISSN (Print)1550-2252

Other

Other2008 IEEE 67th Vehicular Technology Conference-Spring, VTC
CountrySingapore
CityMarina Bay
Period08-05-1108-05-14

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Applied Mathematics

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  • Cite this

    Chin, W. L., & Chen, S. G. (2008). Theoretical analysis of joint synchronization error effects for OFDMA systems. In 2008 IEEE 67th Vehicular Technology Conference-Spring, VTC (pp. 1930-1934). [4525993] (IEEE Vehicular Technology Conference). https://doi.org/10.1109/VETECS.2008.437