THERMAL PROBE

Hao-Chih Liu (Inventor)

Research output: Patent

Abstract

A thermal probe includes a support element, a conductive pattern and a tip. The conductive pattern is disposed at the support element and has plural bending portions. The tip has a base and a pinpoint. The base has a first surface and a second surface which is opposite to the first surface. The pinpoint is disposed at the first surface. The second surface is connected with the conductive pattern. The bending portions are contacted with the first surface. The tip of the thermal probe is replaceable, and the user can choose the optimum combination of the tip, conductive pattern and support element according to their needs.
Original languageEnglish
Patent number8595861
Publication statusPublished - 1800

Fingerprint

Hot Temperature

Cite this

Liu, H-C. (1800). THERMAL PROBE. (Patent No. 8595861).
Liu, Hao-Chih (Inventor). / THERMAL PROBE. Patent No.: 8595861.
@misc{c1ba98d53be94f81aaa7090365da6ad5,
title = "THERMAL PROBE",
abstract = "A thermal probe includes a support element, a conductive pattern and a tip. The conductive pattern is disposed at the support element and has plural bending portions. The tip has a base and a pinpoint. The base has a first surface and a second surface which is opposite to the first surface. The pinpoint is disposed at the first surface. The second surface is connected with the conductive pattern. The bending portions are contacted with the first surface. The tip of the thermal probe is replaceable, and the user can choose the optimum combination of the tip, conductive pattern and support element according to their needs.",
author = "Hao-Chih Liu",
year = "1800",
language = "English",
type = "Patent",
note = "8595861",

}

Liu, H-C 1800, THERMAL PROBE, Patent No. 8595861.

THERMAL PROBE. / Liu, Hao-Chih (Inventor).

Patent No.: 8595861.

Research output: Patent

TY - PAT

T1 - THERMAL PROBE

AU - Liu, Hao-Chih

PY - 1800

Y1 - 1800

N2 - A thermal probe includes a support element, a conductive pattern and a tip. The conductive pattern is disposed at the support element and has plural bending portions. The tip has a base and a pinpoint. The base has a first surface and a second surface which is opposite to the first surface. The pinpoint is disposed at the first surface. The second surface is connected with the conductive pattern. The bending portions are contacted with the first surface. The tip of the thermal probe is replaceable, and the user can choose the optimum combination of the tip, conductive pattern and support element according to their needs.

AB - A thermal probe includes a support element, a conductive pattern and a tip. The conductive pattern is disposed at the support element and has plural bending portions. The tip has a base and a pinpoint. The base has a first surface and a second surface which is opposite to the first surface. The pinpoint is disposed at the first surface. The second surface is connected with the conductive pattern. The bending portions are contacted with the first surface. The tip of the thermal probe is replaceable, and the user can choose the optimum combination of the tip, conductive pattern and support element according to their needs.

M3 - Patent

M1 - 8595861

ER -

Liu H-C, inventor. THERMAL PROBE. 8595861. 1800.