Abstract
The thermal reaction of sputter-deposited Ta thin films with polycrystalline CVD-grown diamond substrates at temperatures between 700°C and 1100°C for 1 h is investigated by MeV He backscattering spectrometry, X-ray diffraction, and scanning electron microscopy. The product phases are polycrystalline Ta2C at 900°C and TaC at 1000°C with an initially 135nm thick Ta film. The first phase formed conforms to the rule of Bené for metal-metal bilayers. No coexistence of Ta2C and TaC is observed during reaction. The second phase formed, TaC, is in thermodynamic equilibrium with carbon.
| Original language | English |
|---|---|
| Pages (from-to) | 72-76 |
| Number of pages | 5 |
| Journal | Thin Solid Films |
| Volume | 236 |
| Issue number | 1-2 |
| DOIs | |
| Publication status | Published - 1993 Dec 15 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry