Thermalelectro-feedback model for multi-emitter finger power heterojunction bipolar transistor Part II: Current crush phenomenon

K. F. Yarn, Yeong-Her Wang, Mau-phon Houng, B. K. Lew

Research output: Contribution to journalArticle

Abstract

Current crush phenomenon, a heat-related mechanism that is commonly observed in experimental I - V characteristic of power HBT, is explained favourably by the thermoelectro-feedback model. A feasible method with proper device geometry or layout to suppress this undesirable phenomenon is provided and experimentally verified.

Original languageEnglish
Pages (from-to)581-588
Number of pages8
JournalInternational Journal of Electronics
Volume93
Issue number9
DOIs
Publication statusPublished - 2006 Sep 1

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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