Thermoelectric property characterization of low-dimensional structures

G. Chen; B. Yang; W. L. Liu; T. Borca-Tasciuc; D. Song; D. Achimov; M. S. Dresselhaus; J. L. Liu; K. Wang

Thermoelectric property characterization of low-dimensional structures

G. Chen, B. Yang, W. L. Liu, T. Borca-Tasciuc, D. Song, D. Achimov, M. S. Dresselhaus, J. L. Liu, K. Wang

College of Electrical Engineering and Computer Science

Research output: Contribution to conference › Paper › peer-review

11 Citations (Scopus)

Abstract

Though of high interest, thermoelectric property characterization of low-dimensional structures is a very challenging task. In this paper, we will discuss issues encountered in the characterization of thermoelectric properties of low-dimensional structures, particularly thin film structures, and their possible solutions. Emphasis is placed on measuring the thermoelectric properties in the same direction, i.e., either parallel or perpendicular to the thin-film plane.

Original language	English
Pages	30-34
Number of pages	5
Publication status	Published - 2001
Event	20th International Conference on Thermoelectrics ICT'01 - Beijing, China Duration: 2001 Jun 8 → 2001 Jun 11

Conference

Conference	20th International Conference on Thermoelectrics ICT'01
Country/Territory	China
City	Beijing
Period	01-06-08 → 01-06-11

All Science Journal Classification (ASJC) codes

Engineering(all)

Cite this

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title = "Thermoelectric property characterization of low-dimensional structures",

abstract = "Though of high interest, thermoelectric property characterization of low-dimensional structures is a very challenging task. In this paper, we will discuss issues encountered in the characterization of thermoelectric properties of low-dimensional structures, particularly thin film structures, and their possible solutions. Emphasis is placed on measuring the thermoelectric properties in the same direction, i.e., either parallel or perpendicular to the thin-film plane.",

author = "G. Chen and B. Yang and Liu, {W. L.} and T. Borca-Tasciuc and D. Song and D. Achimov and Dresselhaus, {M. S.} and Liu, {J. L.} and K. Wang",

year = "2001",

language = "English",

pages = "30--34",

}

TY - CONF

T1 - Thermoelectric property characterization of low-dimensional structures

AU - Chen, G.

AU - Yang, B.

AU - Liu, W. L.

AU - Borca-Tasciuc, T.

AU - Song, D.

AU - Achimov, D.

AU - Dresselhaus, M. S.

AU - Liu, J. L.

AU - Wang, K.

PY - 2001

Y1 - 2001

N2 - Though of high interest, thermoelectric property characterization of low-dimensional structures is a very challenging task. In this paper, we will discuss issues encountered in the characterization of thermoelectric properties of low-dimensional structures, particularly thin film structures, and their possible solutions. Emphasis is placed on measuring the thermoelectric properties in the same direction, i.e., either parallel or perpendicular to the thin-film plane.

AB - Though of high interest, thermoelectric property characterization of low-dimensional structures is a very challenging task. In this paper, we will discuss issues encountered in the characterization of thermoelectric properties of low-dimensional structures, particularly thin film structures, and their possible solutions. Emphasis is placed on measuring the thermoelectric properties in the same direction, i.e., either parallel or perpendicular to the thin-film plane.

UR - http://www.scopus.com/inward/record.url?scp=0035708993&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0035708993&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:0035708993

SP - 30

EP - 34

T2 - 20th International Conference on Thermoelectrics ICT'01

Y2 - 8 June 2001 through 11 June 2001

ER -

Thermoelectric property characterization of low-dimensional structures

Abstract

Conference

All Science Journal Classification (ASJC) codes

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