Though of high interest, thermoelectric property characterization of low-dimensional structures is a very challenging task. In this paper, we will discuss issues encountered in the characterization of thermoelectric properties of low-dimensional structures, particularly thin film structures, and their possible solutions. Emphasis is placed on measuring the thermoelectric properties in the same direction, i.e., either parallel or perpendicular to the thin-film plane.
|Number of pages||5|
|Publication status||Published - 2001|
|Event||20th International Conference on Thermoelectrics ICT'01 - Beijing, China|
Duration: 2001 Jun 8 → 2001 Jun 11
|Conference||20th International Conference on Thermoelectrics ICT'01|
|Period||01-06-08 → 01-06-11|
All Science Journal Classification (ASJC) codes