Thermoelectric property characterization of low-dimensional structures

G. Chen, B. Yang, W. L. Liu, T. Borca-Tasciuc, D. Song, D. Achimov, M. S. Dresselhaus, J. L. Liu, K. Wang

Research output: Contribution to conferencePaperpeer-review

11 Citations (Scopus)

Abstract

Though of high interest, thermoelectric property characterization of low-dimensional structures is a very challenging task. In this paper, we will discuss issues encountered in the characterization of thermoelectric properties of low-dimensional structures, particularly thin film structures, and their possible solutions. Emphasis is placed on measuring the thermoelectric properties in the same direction, i.e., either parallel or perpendicular to the thin-film plane.

Original languageEnglish
Pages30-34
Number of pages5
Publication statusPublished - 2001
Event20th International Conference on Thermoelectrics ICT'01 - Beijing, China
Duration: 2001 Jun 82001 Jun 11

Conference

Conference20th International Conference on Thermoelectrics ICT'01
Country/TerritoryChina
CityBeijing
Period01-06-0801-06-11

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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