Thickness and Refractive Index Measurement System for Multilayered Samples

Chien Sheng Liu, Tzu Yao Weng

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)


In order to simultaneously obtain the thickness and refractive index for each layer of multilayered samples, this paper proposes a novel measurement system with a simple structure by using geometric optics. The key point of the overall structure is that the binary linear equation relation between the upper and lower planes of the layer can be known by the distances between laser spots reflected from the layer. Using two optical paths with different incident angles of laser beams, the CCD sensors capture the spot signal for image processing binarization and data sampling. After the obtained laser spots' spacing is substituted into the equations, the thicknesses and refractive indexes of the multilayered samples can be calculated and measured. The proposed measurement system is characterized numerically using simulations on the commercial software program Zemax and then experimentally tested using a laboratory-built prototype. The experiment results show that the refractive indexes and the thicknesses of three-layer samples were measured with high accuracy (with maximum measurement errors of 2.4% and 2% for a refractive index n and thickness t, respectively).

Original languageEnglish
Article number9343811
Pages (from-to)21474-21480
Number of pages7
JournalIEEE Access
Publication statusPublished - 2021

All Science Journal Classification (ASJC) codes

  • General Computer Science
  • General Materials Science
  • General Engineering


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