Abstract
We have studied the current-voltage characteristics and threshold voltage behaviors in polycrystalline pentacene-based organic thin-film transistors (OTFTs) with gold top-contact electrodes for different thickness of the pentacene films. The study uses a number of techniques to measure threshold voltage including: square-root method, constant-current method, maximum transconductance method and capacitance-voltage measurements. The results of our experiments suggest that the space-charge and trapping effects of the pentacene bulk film plays an important role in current-voltage characteristics. In the presence of trapping centers within the polycrystalline pentacene film, we have provided an analytical model explaining the effect of bulk traps on the thickness-dependent threshold voltage. Square-law of threshold voltage versus pentacene thickness in OTFTs was derived during our study providing consistent results with experimental data. Furthermore, using the square-law, we estimated trap density of about 1017 cm-3 in experimental pentacene films. The orders of magnitude in trap density of polycrystalline pentacene films are similar to the values found in other literature source.
| Original language | English |
|---|---|
| Pages (from-to) | 1107-1111 |
| Number of pages | 5 |
| Journal | Solid-State Electronics |
| Volume | 53 |
| Issue number | 10 |
| DOIs | |
| Publication status | Published - 2009 Oct 1 |
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All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials
- Materials Chemistry
- Condensed Matter Physics
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Thickness-dependent threshold voltage in polycrystalline pentacene-based thin-film transistors. / Wang, Yu W.; Cheng, Horng-Long.
In: Solid-State Electronics, Vol. 53, No. 10, 01.10.2009, p. 1107-1111.Research output: Contribution to journal › Article
TY - JOUR
T1 - Thickness-dependent threshold voltage in polycrystalline pentacene-based thin-film transistors
AU - Wang, Yu W.
AU - Cheng, Horng-Long
PY - 2009/10/1
Y1 - 2009/10/1
N2 - We have studied the current-voltage characteristics and threshold voltage behaviors in polycrystalline pentacene-based organic thin-film transistors (OTFTs) with gold top-contact electrodes for different thickness of the pentacene films. The study uses a number of techniques to measure threshold voltage including: square-root method, constant-current method, maximum transconductance method and capacitance-voltage measurements. The results of our experiments suggest that the space-charge and trapping effects of the pentacene bulk film plays an important role in current-voltage characteristics. In the presence of trapping centers within the polycrystalline pentacene film, we have provided an analytical model explaining the effect of bulk traps on the thickness-dependent threshold voltage. Square-law of threshold voltage versus pentacene thickness in OTFTs was derived during our study providing consistent results with experimental data. Furthermore, using the square-law, we estimated trap density of about 1017 cm-3 in experimental pentacene films. The orders of magnitude in trap density of polycrystalline pentacene films are similar to the values found in other literature source.
AB - We have studied the current-voltage characteristics and threshold voltage behaviors in polycrystalline pentacene-based organic thin-film transistors (OTFTs) with gold top-contact electrodes for different thickness of the pentacene films. The study uses a number of techniques to measure threshold voltage including: square-root method, constant-current method, maximum transconductance method and capacitance-voltage measurements. The results of our experiments suggest that the space-charge and trapping effects of the pentacene bulk film plays an important role in current-voltage characteristics. In the presence of trapping centers within the polycrystalline pentacene film, we have provided an analytical model explaining the effect of bulk traps on the thickness-dependent threshold voltage. Square-law of threshold voltage versus pentacene thickness in OTFTs was derived during our study providing consistent results with experimental data. Furthermore, using the square-law, we estimated trap density of about 1017 cm-3 in experimental pentacene films. The orders of magnitude in trap density of polycrystalline pentacene films are similar to the values found in other literature source.
UR - http://www.scopus.com/inward/record.url?scp=68349128670&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=68349128670&partnerID=8YFLogxK
U2 - 10.1016/j.sse.2009.05.003
DO - 10.1016/j.sse.2009.05.003
M3 - Article
AN - SCOPUS:68349128670
VL - 53
SP - 1107
EP - 1111
JO - Solid-State Electronics
JF - Solid-State Electronics
SN - 0038-1101
IS - 10
ER -