Thickness dependent transport properties and percolative phase separation in polycrystalline manganite thin films

Y. H. Chen; T. B. Wu

doi:10.1063/1.3037202

Thickness dependent transport properties and percolative phase separation in polycrystalline manganite thin films

Y. H. Chen, T. B. Wu

Department of Earth Sciences

Research output: Contribution to journal › Article › peer-review

9 Citations (Scopus)

Abstract

The effects of film thicknesses on the electronic transport and percolative metal-insulator (M-I) transition of La_1-xSr_xMnO ₃ (LSMO) films have been investigated. The conductivity increases with the layer thickness; this is regarded as the relaxation of tensile strains and reduction in grain boundaries (fewer scattering centers) as well as shorter hopping distances, which suppresses the Jahn-Teller distortion or enhances the double exchange. It is also observed by conductive atomic force microscopy (CAFM) that metallic and insulating regions coexist in LSMO films. The domains undergo a percolative M-I transition, and T_M-I observed by CAFM is consistent with the result of four-point probe measurements.

Original language	English
Article number	224104
Journal	Applied Physics Letters
Volume	93
Issue number	22
DOIs	https://doi.org/10.1063/1.3037202
Publication status	Published - 2008

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.3037202

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abstract = "The effects of film thicknesses on the electronic transport and percolative metal-insulator (M-I) transition of La1-xSrxMnO 3 (LSMO) films have been investigated. The conductivity increases with the layer thickness; this is regarded as the relaxation of tensile strains and reduction in grain boundaries (fewer scattering centers) as well as shorter hopping distances, which suppresses the Jahn-Teller distortion or enhances the double exchange. It is also observed by conductive atomic force microscopy (CAFM) that metallic and insulating regions coexist in LSMO films. The domains undergo a percolative M-I transition, and TM-I observed by CAFM is consistent with the result of four-point probe measurements.",

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AB - The effects of film thicknesses on the electronic transport and percolative metal-insulator (M-I) transition of La1-xSrxMnO 3 (LSMO) films have been investigated. The conductivity increases with the layer thickness; this is regarded as the relaxation of tensile strains and reduction in grain boundaries (fewer scattering centers) as well as shorter hopping distances, which suppresses the Jahn-Teller distortion or enhances the double exchange. It is also observed by conductive atomic force microscopy (CAFM) that metallic and insulating regions coexist in LSMO films. The domains undergo a percolative M-I transition, and TM-I observed by CAFM is consistent with the result of four-point probe measurements.

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Thickness dependent transport properties and percolative phase separation in polycrystalline manganite thin films

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