Thickness effect on stress-induced exchange anisotropy of NiFe/NiFeMn

Chih Huang Lai; Shing An Chen; J. C.A. Huang

doi:10.1063/1.372801

Thickness effect on stress-induced exchange anisotropy of NiFe/NiFeMn

Chih Huang Lai, Shing An Chen, J. C.A. Huang

Department of Physics

Research output: Contribution to journal › Conference article › peer-review

4 Citations (Scopus)

Abstract

Samples with the structure Mo (20 nm)/NiFe (t nm)/NiFeMn (12 nm)/Mo (2 nm) were grown on the Al₂O₃ (11-20) substrates by a MBE system. Although no magnetic field was applied during depositions, shifted hysteresis loops were observed in as-deposited samples, which were attributable to the stress-induced exchange anisotropy. With increasing thickness of NiFe, the residual stress on NiFe decreased, which resulted in the decrease of NiFe anisotropy. The exchange field decreased with increasing NiFe thickness but with a transition point at t = 12nm, at which the residual stress on top of NiFe might be significantly released.

Original language	English
Pages (from-to)	6656-6658
Number of pages	3
Journal	Journal of Applied Physics
Volume	87
Issue number	9 III
DOIs	https://doi.org/10.1063/1.372801
Publication status	Published - 2000 May 1
Event	44th Annual Conference on Magnetism and Magnetic Materials - San Jose, CA, United States Duration: 1999 Nov 15 → 1999 Nov 18

All Science Journal Classification (ASJC) codes

General Physics and Astronomy

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10.1063/1.372801

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title = "Thickness effect on stress-induced exchange anisotropy of NiFe/NiFeMn",

abstract = "Samples with the structure Mo (20 nm)/NiFe (t nm)/NiFeMn (12 nm)/Mo (2 nm) were grown on the Al2O3 (11-20) substrates by a MBE system. Although no magnetic field was applied during depositions, shifted hysteresis loops were observed in as-deposited samples, which were attributable to the stress-induced exchange anisotropy. With increasing thickness of NiFe, the residual stress on NiFe decreased, which resulted in the decrease of NiFe anisotropy. The exchange field decreased with increasing NiFe thickness but with a transition point at t = 12nm, at which the residual stress on top of NiFe might be significantly released.",

author = "Lai, {Chih Huang} and Chen, {Shing An} and Huang, {J. C.A.}",

year = "2000",

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doi = "10.1063/1.372801",

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volume = "87",

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journal = "Journal of Applied Physics",

issn = "0021-8979",

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note = "44th Annual Conference on Magnetism and Magnetic Materials ; Conference date: 15-11-1999 Through 18-11-1999",

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TY - JOUR

T1 - Thickness effect on stress-induced exchange anisotropy of NiFe/NiFeMn

AU - Lai, Chih Huang

AU - Chen, Shing An

AU - Huang, J. C.A.

PY - 2000/5/1

Y1 - 2000/5/1

N2 - Samples with the structure Mo (20 nm)/NiFe (t nm)/NiFeMn (12 nm)/Mo (2 nm) were grown on the Al2O3 (11-20) substrates by a MBE system. Although no magnetic field was applied during depositions, shifted hysteresis loops were observed in as-deposited samples, which were attributable to the stress-induced exchange anisotropy. With increasing thickness of NiFe, the residual stress on NiFe decreased, which resulted in the decrease of NiFe anisotropy. The exchange field decreased with increasing NiFe thickness but with a transition point at t = 12nm, at which the residual stress on top of NiFe might be significantly released.

AB - Samples with the structure Mo (20 nm)/NiFe (t nm)/NiFeMn (12 nm)/Mo (2 nm) were grown on the Al2O3 (11-20) substrates by a MBE system. Although no magnetic field was applied during depositions, shifted hysteresis loops were observed in as-deposited samples, which were attributable to the stress-induced exchange anisotropy. With increasing thickness of NiFe, the residual stress on NiFe decreased, which resulted in the decrease of NiFe anisotropy. The exchange field decreased with increasing NiFe thickness but with a transition point at t = 12nm, at which the residual stress on top of NiFe might be significantly released.

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U2 - 10.1063/1.372801

DO - 10.1063/1.372801

M3 - Conference article

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SN - 0021-8979

VL - 87

SP - 6656

EP - 6658

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 9 III

T2 - 44th Annual Conference on Magnetism and Magnetic Materials

Y2 - 15 November 1999 through 18 November 1999

ER -

Thickness effect on stress-induced exchange anisotropy of NiFe/NiFeMn

Abstract

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