Thickness effect on stress-induced exchange anisotropy of NiFe/NiFeMn

Chih Huang Lai, Shing A. Chen, Jung-Chun Huang

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Samples with the structure Mo (20 nm)/NiFe (t nm)/NiFeMn (12 nm)/Mo (2 nm) were grown on the Al2O3 (11-20) substrates by a MBE system. Although no magnetic field was applied during depositions, shifted hysteresis loops were observed in as-deposited samples, which were attributable to the stress-induced exchange anisotropy. With increasing thickness of NiFe, the residual stress on NiFe decreased, which resulted in the decrease of NiFe anisotropy. The exchange field decreased with increasing NiFe thickness but with a transition point at t = 12nm, at which the residual stress on top of NiFe might be significantly released.

Original languageEnglish
Pages (from-to)6656-6658
Number of pages3
JournalJournal of Applied Physics
Volume87
Issue number9 III
Publication statusPublished - 2000 May 1

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residual stress
anisotropy
transition points
hysteresis
magnetic fields

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)
  • Physics and Astronomy (miscellaneous)

Cite this

Lai, Chih Huang ; Chen, Shing A. ; Huang, Jung-Chun. / Thickness effect on stress-induced exchange anisotropy of NiFe/NiFeMn. In: Journal of Applied Physics. 2000 ; Vol. 87, No. 9 III. pp. 6656-6658.
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Thickness effect on stress-induced exchange anisotropy of NiFe/NiFeMn. / Lai, Chih Huang; Chen, Shing A.; Huang, Jung-Chun.

In: Journal of Applied Physics, Vol. 87, No. 9 III, 01.05.2000, p. 6656-6658.

Research output: Contribution to journalArticle

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