TY - GEN
T1 - Three-dimensional micro-flow measurement in a capillary with a diode laser micro-particle image velocitmetry
AU - Pan, C. T.
AU - Cheng, P. J.
AU - Hwang, Y. M.
AU - Chen, M. F.
AU - Chuang, H. S.
AU - Yang, C. T.
PY - 2006
Y1 - 2006
N2 - A self-built micro-particle image velocimetry (micro-PIV) with a diode laser is established to measure the micro-fluidic phenomenon in a 100 μm rectangular capillary. By scanning method, a 3-D flow image with a flowrate of 0.3 μL/min is presented. With this calibration method, the measurement ability for 3-D micro-fluidic dynamics could be achieved. This technique also reveals its benefit and potential in metrology. Hence, it provides a helpful tool for Bio-MEMS research. The experiment is proceeded under laminar flow, Re= 0.011. The measurement range is ranging from 0.05um/s to 4.3mm/s. The vector grid resolution is optimized to 2.5 μm.
AB - A self-built micro-particle image velocimetry (micro-PIV) with a diode laser is established to measure the micro-fluidic phenomenon in a 100 μm rectangular capillary. By scanning method, a 3-D flow image with a flowrate of 0.3 μL/min is presented. With this calibration method, the measurement ability for 3-D micro-fluidic dynamics could be achieved. This technique also reveals its benefit and potential in metrology. Hence, it provides a helpful tool for Bio-MEMS research. The experiment is proceeded under laminar flow, Re= 0.011. The measurement range is ranging from 0.05um/s to 4.3mm/s. The vector grid resolution is optimized to 2.5 μm.
UR - http://www.scopus.com/inward/record.url?scp=35348827877&partnerID=8YFLogxK
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U2 - 10.4028/0-87849-990-3.343
DO - 10.4028/0-87849-990-3.343
M3 - Conference contribution
AN - SCOPUS:35348827877
SN - 0878499903
SN - 9780878499908
T3 - Materials Science Forum
SP - 343
EP - 348
BT - Progress on Advanced Manufacture for Micro/Nano Technology 2005 - Proceedings of the 2005 International Conference on Advanced Manufacture
PB - Trans Tech Publications Ltd
T2 - 2005 International Conference on Advanced Manufacture, ICAM2005
Y2 - 28 November 2005 through 2 December 2005
ER -