Three-terminal switching device with InGaAs/GaAs/InGaAs hole confinement layer

Wen Shiung Lour, Wen-Chau Liu, Jung Hui Tsai, Lih Wen Laih, Jiann Ru Chen, Ming Kwen Tsai

Research output: Contribution to conferencePaperpeer-review

Abstract

We report a new switching device with back-to-back AlGaAs planar-doped barrier and InGaAs/GaAs/InGaAs well grown by molecular beam epitaxy, which exhibiting S-shape negative differential resistance (NDR). The device has a large potential barrier between the anode and cathode regions which can be modulated via a third terminal. The NDR phenomenon is attributed mainly to impact ionization within the undoped anode region. Due to the better confinement effect on holes for a double InGaAs/GaAs/InGaAs quantum well, experimental results reveal that good switch behavior and higher turn on current were obtained in our improved device. When external bias is applied to the third electrode, we observe voltage-dependent switching voltage and holding voltage, this introduces multiple stable regimes of the device operation. Therefore, base on a proper design, the studied device has good potential for proposed multiple-valued logic circuit application or acts as an inverter.

Original languageEnglish
Pages95-98
Number of pages4
Publication statusPublished - 1995 Dec 1
EventProceedings of the 1995 IEEE Region 10 International Conference on Microelectronics and VLSI, TENCON'95 - Hong Kong, Hong Kong
Duration: 1995 Nov 61995 Nov 10

Other

OtherProceedings of the 1995 IEEE Region 10 International Conference on Microelectronics and VLSI, TENCON'95
CityHong Kong, Hong Kong
Period95-11-0695-11-10

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Electrical and Electronic Engineering

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