THz acoustic spectroscopy based on GaN nanostructures

Kung Hsuan Lin, Dzung Han Tsai, Kuan Jen Wang, Sheng Hui Chen, Kai Lun Chi, Jin Wei Shi, Po Cheng Chen, Jinn Kong Sheu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Due to the high attenuation in vitreous silica, acoustic attenuations in the THz regime are typically measured by incoherent techniques such as Raman, neutron, and X-ray scattering. Here, we utilized multiple-quantum-well structures to demonstrate acoustic spectroscopy of vitreous silica up to THz regime. The acoustic properties of silica thin films prepared by chemical deposition methods were characterized in the sub-THz regime. This technique may be useful in resolving debated issues relating to Boson peak around 1 THz.

Original languageEnglish
Title of host publicationUltrafast Phenomena and Nanophotonics XVIII
DOIs
Publication statusPublished - 2014 Apr 14
EventUltrafast Phenomena and Nanophotonics XVIII - San Francisco, CA, United States
Duration: 2014 Feb 22014 Feb 5

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8984
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherUltrafast Phenomena and Nanophotonics XVIII
CountryUnited States
CitySan Francisco, CA
Period14-02-0214-02-05

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Lin, K. H., Tsai, D. H., Wang, K. J., Chen, S. H., Chi, K. L., Shi, J. W., Chen, P. C., & Sheu, J. K. (2014). THz acoustic spectroscopy based on GaN nanostructures. In Ultrafast Phenomena and Nanophotonics XVIII [89840C] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8984). https://doi.org/10.1117/12.2036171