Original language | English |
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Title of host publication | The 24th International Conference on Technologies and Applications of Artificial Intelligence (TAAI) |
Place of Publication | Kaohsiung, Taiwan |
Publication status | Published - 2019 Nov |
Tool Defect Detection and Classification Using Modified RetinaNet
H.C. Yin, S.C. Liu, J.C. Chen, S.M. Guo, James Jenn-Jier Lien
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution