Tool Defect Detection and Classification Using Modified RetinaNet

H.C. Yin, S.C. Liu, J.C. Chen, S.M. Guo, James Jenn-Jier Lien

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	The 24th International Conference on Technologies and Applications of Artificial Intelligence (TAAI)
Place of Publication	Kaohsiung, Taiwan
Publication status	Published - 2019 Nov

Cite this

@inproceedings{a93d2cec691d42a88881f6e3e2b28491,

title = "Tool Defect Detection and Classification Using Modified RetinaNet",

author = "H.C. Yin and S.C. Liu and J.C. Chen and S.M. Guo and Lien, {James Jenn-Jier}",

year = "2019",

month = nov,

language = "English",

booktitle = "The 24th International Conference on Technologies and Applications of Artificial Intelligence (TAAI)",

}