Tool Defect Detection and Classification Using Modified RetinaNet

H.C. Yin, S.C. Liu, J.C. Chen, S.M. Guo, James Jenn-Jier Lien

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationThe 24th International Conference on Technologies and Applications of Artificial Intelligence (TAAI)
Place of PublicationKaohsiung, Taiwan
Publication statusPublished - 2019 Nov

Cite this