Transformation of multiple fault models to a unified model for ATPG efficiency enhancement

Cheng Hung Wu, Kuen Jong Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)


This paper presents a systematic approach to transform various fault models to a unified model such that all faults of interest can be handled in one ATPG run. The fault models that can be transformed include, but are not limited to, stuck-At faults, various types of bridging faults, and cell-internal faults. The unified model is the aggressor-victim type of bridging fault model. Two transformation methods, namely fault-based and pattern-based transformations, are developed for cell-external and cell-internal faults, respectively. With the proposed approach, one can use an ATPG tool for bridging faults to deal with the test generation problems of multiple fault models simultaneously. Hence the total test generation time can be reduced and highly compact test sets can be obtained. Experimental results show that on average 54.94% (16.45%) and 47.22% (17.51%) test pattern volume reductions are achieved compared to the method that deals with the three fault models separately without (with) fault dropping for ISCAS'89 andIWLS'05 circuits, respectively.

Original languageEnglish
Title of host publicationProceedings - 2016 IEEE International Test Conference, ITC 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781467387736
Publication statusPublished - 2016 Jul 2
Event47th IEEE International Test Conference, ITC 2016 - Fort Worth, United States
Duration: 2016 Nov 152016 Nov 17

Publication series

NameProceedings - International Test Conference
ISSN (Print)1089-3539


Other47th IEEE International Test Conference, ITC 2016
CountryUnited States
CityFort Worth

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Applied Mathematics

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