Transient moment relaxation in high-temperature superconductors

Y. Y. Xue, L. Gao, Y. T. Ren, W. C. Chan, P. H. Hor, C. W. Chu

Research output: Contribution to journalArticlepeer-review

16 Citations (Scopus)

Abstract

The decays of the persistent supercurrent have been derived for several characteristic I-V relationships with few sample-dependent parameters. The results are compared with recent short-time flux-creep data in a short transient time window (10-4102 s). The results favor the I-V characteristics Vexp[-(I0/I)], as predicted by the collective-pinning and vortex-glass models. However, the so obtained is greater than 1, in contrast with that predicted. This may imply a different type of vortex elemental excitation observed in our low-field conditions.

Original languageEnglish
Pages (from-to)12029-12032
Number of pages4
JournalPhysical Review B
Volume44
Issue number21
DOIs
Publication statusPublished - 1991

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics

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