Transient Thermal Analysis of Si-based Solar Cell Using Electrical Junction-Temperature Measurement and Impedance Spectroscopy

Yu Hsueh Chin, Shui-Jinn Wang, Chien Hsiung Hung, Ya Chi Huang, Chien-Hung Wu, Nai Sheng Wu, Hao Ping Yan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication2016 International Conference on Solid State Devices and Materials (SSDM’16)
Place of PublicationTsukuba, Japan
Publication statusPublished - 2016 Sep 26

Cite this

Chin, Y. H., Wang, S-J., Hung, C. H., Huang, Y. C., Wu, C-H., Wu, N. S., & Yan, H. P. (2016). Transient Thermal Analysis of Si-based Solar Cell Using Electrical Junction-Temperature Measurement and Impedance Spectroscopy. In 2016 International Conference on Solid State Devices and Materials (SSDM’16)