@inproceedings{6f4670dc122f45f4bd8d38bc5fa04649,
title = "Turbo1500: Toward core-based design for test and diagnosis using the IEEE 1500 standard",
abstract = "This paper describes a core-based test and diagnosis integration and automation system, called Turbo1500, which automatically synthesizes test and diagnosis logic in accordance with the IEEE 1500 standard. Turbo1500 serves two major purposes. One is for use as a core test automation tool in a system-on-chip (SOC) environment to automatically connect multiple cores from various sources and create testbenches each targeting an individual core under the control of a chip-level test access port (TAP) controller. The other is for hierarchical (block-by-block) core test and diagnosis when chips on a printed-circuit board are embedded with 1149.1 boundary scan I/O cells and cores under test and diagnosis are surrounded with 1500-compliant wrapper cells. Application experience showed that the simplicity of the IEEE 1500 standard combined with an easy-to-use automation tool can make core-based design for test and diagnosis no longer a nightmare, especially when some cores are extremely large or complex.",
author = "Wang, {Laung Terng} and Ravi Apte and Shianling Wu and Boryau Sheu and Lee, {Kuen Jong} and Xiaoqing Wen and Jone, {Wen Ben} and Yeh, {Chia Hsien} and Wang, {Wei Shin} and Chao, {Hao Jan} and Jianghao Guo and Jinsong Liu and Yanlong Niu and Sung, {Yi Chih} and Wang, {Chi Chun} and Fangfang Li",
year = "2008",
doi = "10.1109/TEST.2008.4700630",
language = "English",
isbn = "9781424424030",
series = "Proceedings - International Test Conference",
booktitle = "Proceedings - International Test Conference 2008, ITC 2008",
note = "International Test Conference 2008, ITC 2008 ; Conference date: 28-10-2008 Through 30-10-2008",
}