Turbo1500: Toward core-based design for test and diagnosis using the IEEE 1500 standard

Laung Terng Wang, Ravi Apte, Shianling Wu, Boryau Sheu, Kuen Jong Lee, Xiaoqing Wen, Wen Ben Jone, Chia Hsien Yeh, Wei Shin Wang, Hao Jan Chao, Jianghao Guo, Jinsong Liu, Yanlong Niu, Yi Chih Sung, Chi Chun Wang, Fangfang Li

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)


This paper describes a core-based test and diagnosis integration and automation system, called Turbo1500, which automatically synthesizes test and diagnosis logic in accordance with the IEEE 1500 standard. Turbo1500 serves two major purposes. One is for use as a core test automation tool in a system-on-chip (SOC) environment to automatically connect multiple cores from various sources and create testbenches each targeting an individual core under the control of a chip-level test access port (TAP) controller. The other is for hierarchical (block-by-block) core test and diagnosis when chips on a printed-circuit board are embedded with 1149.1 boundary scan I/O cells and cores under test and diagnosis are surrounded with 1500-compliant wrapper cells. Application experience showed that the simplicity of the IEEE 1500 standard combined with an easy-to-use automation tool can make core-based design for test and diagnosis no longer a nightmare, especially when some cores are extremely large or complex.

Original languageEnglish
Title of host publicationProceedings - International Test Conference 2008, ITC 2008
Publication statusPublished - 2008
EventInternational Test Conference 2008, ITC 2008 - Santa Clara, CA, United States
Duration: 2008 Oct 282008 Oct 30

Publication series

NameProceedings - International Test Conference
ISSN (Print)1089-3539


OtherInternational Test Conference 2008, ITC 2008
Country/TerritoryUnited States
CitySanta Clara, CA

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Applied Mathematics


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