Two control and observation structures for analogue circuits

Kuen-Jong Lee, Yun Che Wen

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Two novel analogue control and observation structures which can be used to increase the testability of analogue circuits are presented. Both structures can be easily incorporated into the IEEE P 1149.4 environment to execute both DC and AC testing. The first structure consists of five switches and can perform concurrent testing. The second contains only four switches but is mainly used for off-line testing.

Original languageEnglish
Pages (from-to)1590-1592
Number of pages3
JournalElectronics Letters
Volume33
Issue number19
DOIs
Publication statusPublished - 1997 Sep 11

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Analog circuits
Testing
Switches

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Lee, Kuen-Jong ; Wen, Yun Che. / Two control and observation structures for analogue circuits. In: Electronics Letters. 1997 ; Vol. 33, No. 19. pp. 1590-1592.
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Two control and observation structures for analogue circuits. / Lee, Kuen-Jong; Wen, Yun Che.

In: Electronics Letters, Vol. 33, No. 19, 11.09.1997, p. 1590-1592.

Research output: Contribution to journalArticle

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