TY - GEN
T1 - Two-dimensional electromagnetic Child-Langmuir law of a short-pulse electron flow
AU - Liu, Yao Li
AU - Tai, Ling Chieh
AU - Chen, Shih Hung
AU - Ang, Lay Kee
AU - Koh, Wee Shing
PY - 2011
Y1 - 2011
N2 - Two-dimensional electromagnetic (EM) particle-in-cell simulations were performed to study the effect of the displacement current and the self-magnetic field on the space-charge limited current density or the Child-Langmuir law of a short-pulse electron flow with a propagation distance of ζ and an emitting width of W from the classical regime to the relativistic regime. Numerical scaling of the two-dimensional electromagnetic Child-Langmuir (CL) law was constructed, and it scales with (ζ / W) and (ζ / W)2 at the classical and relativistic regimes, respectively. Our findings reveal that the displacement current can considerably enhance the space-charge limited (SCL) current density as compared to the well-known two-dimensional electrostatic (ES) Child-Langmuir law even at the classical regime.
AB - Two-dimensional electromagnetic (EM) particle-in-cell simulations were performed to study the effect of the displacement current and the self-magnetic field on the space-charge limited current density or the Child-Langmuir law of a short-pulse electron flow with a propagation distance of ζ and an emitting width of W from the classical regime to the relativistic regime. Numerical scaling of the two-dimensional electromagnetic Child-Langmuir (CL) law was constructed, and it scales with (ζ / W) and (ζ / W)2 at the classical and relativistic regimes, respectively. Our findings reveal that the displacement current can considerably enhance the space-charge limited (SCL) current density as compared to the well-known two-dimensional electrostatic (ES) Child-Langmuir law even at the classical regime.
UR - http://www.scopus.com/inward/record.url?scp=79955759275&partnerID=8YFLogxK
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U2 - 10.1109/IVEC.2011.5747054
DO - 10.1109/IVEC.2011.5747054
M3 - Conference contribution
AN - SCOPUS:79955759275
SN - 9781424486595
T3 - 2011 IEEE International Vacuum Electronics Conference, IVEC-2011
SP - 419
EP - 420
BT - 2011 IEEE International Vacuum Electronics Conference, IVEC-2011
T2 - 2011 IEEE International Vacuum Electronics Conference, IVEC-2011
Y2 - 21 February 2011 through 24 February 2011
ER -