@inproceedings{84039e5f84b746038caae431b31d7426,
title = "Ultralow Power Neuromorphic Accelerator for Deep Learning Using Ni/HfO2/TiN Resistive Random Access Memory",
abstract = "In this article we explore Ni/HfO2/TiN resistive random access memory (RRAM) as ultralow power synaptic element in deep neural networks (DNN) for artificial intelligence applications. Low power RRAM devices are fabricated and measured, with very low RESET current and 2-3 orders of resistance window. The SET-RESET current-voltage characteristics, high-and low-resistance state statistical distribution, and analog programming characteristics are calibrated to analytical models. Training and inference for the MNIST handwritten digits dataset using a multilayer perceptron was simulated based on the calibrated model using CIMulator, a novel neuromorphic simulation platform for compute-in-memory circuitry to predict DNN inference accuracy and energy consumption. Despite larger inherent device-to-device variability due to low on current, 97% inference accuracy is achieved with only 2-bit for the weights using weight update accumulation technique.",
author = "Le, {Hoang Hiep} and Hong, {Wei Chen} and Du, {Jian Wei} and Lin, {Tsung Han} and Hong, {Yi Xiu} and Chen, {I. Hsuan} and Lee, {Wen Jay} and Chen, {Nan Yow} and Lu, {Darsen D.}",
note = "Funding Information: This project is supported by Ministry of Science and Technology, Taiwan, through grant MOST-108-2634-F-006-08, and is part of research work by MOST{\textquoteright}s AI Biomedical Research Center. Publisher Copyright: {\textcopyright} 2020 IEEE.; 4th Electron Devices Technology and Manufacturing Conference, EDTM 2020 ; Conference date: 06-04-2020 Through 21-04-2020",
year = "2020",
month = apr,
doi = "10.1109/EDTM47692.2020.9117915",
language = "English",
series = "4th Electron Devices Technology and Manufacturing Conference, EDTM 2020 - Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "4th Electron Devices Technology and Manufacturing Conference, EDTM 2020 - Proceedings",
address = "United States",
}