TY - GEN
T1 - Unsupervised Concept Drift Detection Using Dynamic Crucial Feature Distribution Test in Data Streams
AU - Wan, Yen Ning
AU - Bijay, Prasad Jaysawal
AU - Huang, Jen Wei
N1 - Publisher Copyright:
© 2022 IEEE.
PY - 2022
Y1 - 2022
N2 - Distribution of data often changes over time and leads to the unpredictable changes in the implicit information behind data streams. This phenomenon is referred to as Concept Drift. The accuracy of conventional models reduces as time goes by, and old models are rendered impractical. In this paper, we propose a novel approach for solving the concept drift detection problem using the unsupervised method and focusing on the dynamic crucial feature distribution test. Extensive experiments have been done to evaluate the performance of the proposed method against classic and state-of-the-art methods. Experimental results demonstrate the efficacy of the proposed model when applied to synthetic as well as real-world datasets.
AB - Distribution of data often changes over time and leads to the unpredictable changes in the implicit information behind data streams. This phenomenon is referred to as Concept Drift. The accuracy of conventional models reduces as time goes by, and old models are rendered impractical. In this paper, we propose a novel approach for solving the concept drift detection problem using the unsupervised method and focusing on the dynamic crucial feature distribution test. Extensive experiments have been done to evaluate the performance of the proposed method against classic and state-of-the-art methods. Experimental results demonstrate the efficacy of the proposed model when applied to synthetic as well as real-world datasets.
UR - http://www.scopus.com/inward/record.url?scp=85150065690&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85150065690&partnerID=8YFLogxK
U2 - 10.1109/TAAI57707.2022.00033
DO - 10.1109/TAAI57707.2022.00033
M3 - Conference contribution
AN - SCOPUS:85150065690
T3 - Proceedings - 2022 International Conference on Technologies and Applications of Artificial Intelligence, TAAI 2022
SP - 137
EP - 142
BT - Proceedings - 2022 International Conference on Technologies and Applications of Artificial Intelligence, TAAI 2022
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 27th International Conference on Technologies and Applications of Artificial Intelligence, TAAI 2022
Y2 - 1 December 2022 through 3 December 2022
ER -