Using Syndrome Compression for Memory Built-In Self-Diagnosis

Cheng-Wen Wu, J.-F. Li, R.-S. Tzeng

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Citations (Scopus)
Original languageEnglish
Title of host publicationIEEE Int. Symp. on VLSI Technology, Systems, and Applications (VLSI-TSA)
Place of Publication Hsinchu
Publication statusPublished - 2001 Apr

Cite this

Wu, C-W., Li, J-F., & Tzeng, R-S. (2001). Using Syndrome Compression for Memory Built-In Self-Diagnosis. In IEEE Int. Symp. on VLSI Technology, Systems, and Applications (VLSI-TSA)