| Original language | English |
|---|---|
| Title of host publication | IEEE Int. Symp. on VLSI Technology, Systems, and Applications (VLSI-TSA) |
| Place of Publication | Hsinchu |
| Publication status | Published - 2001 Apr |
Using Syndrome Compression for Memory Built-In Self-Diagnosis
- Cheng-Wen Wu
- , J.-F. Li
- , R.-S. Tzeng
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
11
Citations
(Scopus)