Using Unstable SRAM Bits for Physical Unclonable Function Applications on Off-The-Shelf SRAM

Zhi Wei Lai, Kuen Jong Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Abstract

Physical Unclonable Function (PUF) is recently used in modern electronic systems for device authentication and secret key generation. SRAM PUF is a popular memory-based PUF because it is a standard component for most electronic devices. Previously only strongly stable RAM bits are selected as PUF bits in order to achieve high reliability, hence requiring relatively large SRAM. Furthermore, SRAM PUF might suffer from PUF clone attack for using stable bits. Attackers may use Photon Emission Analysis (PEA) to observe the behavior of the stable bits and conducted Focused Ion Beam circuit edit (FIBCE) to produce an identical physical response. In this paper, we propose a new method that employs unstable bits as PUF bits in addition to the stable bits to increase the SRAM bit usage rate. We also show that this method can efficiently resist the PUF clone attack. Experimental results show that even though our proposed method uses unstable bits as PUF bits, it can still achieve high reliability. It can reach an average 2% intra-HD without Error Correction Code (ECC) under various conditions and an average inter-HD of 49.33%.

Original languageEnglish
Title of host publicationProceedings - APCCAS 2019
Subtitle of host publication2019 IEEE Asia Pacific Conference on Circuits and Systems: Innovative CAS Towards Sustainable Energy and Technology Disruption
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages41-44
Number of pages4
ISBN (Electronic)9781728129402
DOIs
Publication statusPublished - 2019 Nov
Event15th Annual IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2019 - Bangkok, Thailand
Duration: 2019 Nov 112019 Nov 14

Publication series

NameProceedings - APCCAS 2019: 2019 IEEE Asia Pacific Conference on Circuits and Systems: Innovative CAS Towards Sustainable Energy and Technology Disruption

Conference

Conference15th Annual IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2019
Country/TerritoryThailand
CityBangkok
Period19-11-1119-11-14

All Science Journal Classification (ASJC) codes

  • Energy Engineering and Power Technology
  • Renewable Energy, Sustainability and the Environment
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Instrumentation

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