TY - GEN
T1 - Using Unstable SRAM Bits for Physical Unclonable Function Applications on Off-The-Shelf SRAM
AU - Lai, Zhi Wei
AU - Lee, Kuen Jong
PY - 2019/11
Y1 - 2019/11
N2 - Physical Unclonable Function (PUF) is recently used in modern electronic systems for device authentication and secret key generation. SRAM PUF is a popular memory-based PUF because it is a standard component for most electronic devices. Previously only strongly stable RAM bits are selected as PUF bits in order to achieve high reliability, hence requiring relatively large SRAM. Furthermore, SRAM PUF might suffer from PUF clone attack for using stable bits. Attackers may use Photon Emission Analysis (PEA) to observe the behavior of the stable bits and conducted Focused Ion Beam circuit edit (FIBCE) to produce an identical physical response. In this paper, we propose a new method that employs unstable bits as PUF bits in addition to the stable bits to increase the SRAM bit usage rate. We also show that this method can efficiently resist the PUF clone attack. Experimental results show that even though our proposed method uses unstable bits as PUF bits, it can still achieve high reliability. It can reach an average 2% intra-HD without Error Correction Code (ECC) under various conditions and an average inter-HD of 49.33%.
AB - Physical Unclonable Function (PUF) is recently used in modern electronic systems for device authentication and secret key generation. SRAM PUF is a popular memory-based PUF because it is a standard component for most electronic devices. Previously only strongly stable RAM bits are selected as PUF bits in order to achieve high reliability, hence requiring relatively large SRAM. Furthermore, SRAM PUF might suffer from PUF clone attack for using stable bits. Attackers may use Photon Emission Analysis (PEA) to observe the behavior of the stable bits and conducted Focused Ion Beam circuit edit (FIBCE) to produce an identical physical response. In this paper, we propose a new method that employs unstable bits as PUF bits in addition to the stable bits to increase the SRAM bit usage rate. We also show that this method can efficiently resist the PUF clone attack. Experimental results show that even though our proposed method uses unstable bits as PUF bits, it can still achieve high reliability. It can reach an average 2% intra-HD without Error Correction Code (ECC) under various conditions and an average inter-HD of 49.33%.
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U2 - 10.1109/APCCAS47518.2019.8953143
DO - 10.1109/APCCAS47518.2019.8953143
M3 - Conference contribution
T3 - Proceedings - APCCAS 2019: 2019 IEEE Asia Pacific Conference on Circuits and Systems: Innovative CAS Towards Sustainable Energy and Technology Disruption
SP - 41
EP - 44
BT - Proceedings - APCCAS 2019
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 15th Annual IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2019
Y2 - 11 November 2019 through 14 November 2019
ER -