UTEMS: A Unit Testing Scheme for Event-driven Microservices

Shang Pin Ma, Yu Yung Yang, Shin Jie Lee, Hang Wei Yeh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper introduces a novel scheme to facilitate unit testing for event-driven microservices. The proposed approach includes implementation procedures formulated in accordance with the message broker, event publishing and consumption, and individual steps in the saga design pattern. The proposed approach makes it possible to formulate unit test cases that effectively capture errors associated with publishing, the channel subscription process, invalid message formatting, and ineffective error remediation methods.

Original languageEnglish
Title of host publicationProceedings - 2023 10th International Conference on Dependable Systems and Their Applications, DSA 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages591-592
Number of pages2
ISBN (Electronic)9798350304770
DOIs
Publication statusPublished - 2023
Event10th International Conference on Dependable Systems and Their Applications, DSA 2023 - Tokyo, Japan
Duration: 2023 Aug 102023 Aug 11

Publication series

NameProceedings - 2023 10th International Conference on Dependable Systems and Their Applications, DSA 2023

Conference

Conference10th International Conference on Dependable Systems and Their Applications, DSA 2023
Country/TerritoryJapan
CityTokyo
Period23-08-1023-08-11

All Science Journal Classification (ASJC) codes

  • Artificial Intelligence
  • Computer Networks and Communications
  • Computer Science Applications
  • Software
  • Information Systems
  • Safety, Risk, Reliability and Quality

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