TY - GEN
T1 - Variational Channel Distribution Pruning and Mixed-Precision Quantization for Neural Network Model Compression
AU - Chang, Wan Ting
AU - Kuo, Chih Hung
AU - Fang, Li Chun
N1 - Publisher Copyright:
© 2022 IEEE.
PY - 2022
Y1 - 2022
N2 - This paper presents a model compression frame-work for both pruning and quantizing according to the channel distribution information. We apply the variational inference technique to train a Bayesian deep neural network, in which the parameters are modeled by probability distributions. According to the characteristic of the probability distribution, we can prune the redundant channels and determine the bit-width layer by layer. The experiments conducted on the CIFAR10 dataset with the VGG16 show that the number of parameters can be saved by 58.91x. The proposed compression approach can help implement hardware circuits for efficient edge and mobile computing.
AB - This paper presents a model compression frame-work for both pruning and quantizing according to the channel distribution information. We apply the variational inference technique to train a Bayesian deep neural network, in which the parameters are modeled by probability distributions. According to the characteristic of the probability distribution, we can prune the redundant channels and determine the bit-width layer by layer. The experiments conducted on the CIFAR10 dataset with the VGG16 show that the number of parameters can be saved by 58.91x. The proposed compression approach can help implement hardware circuits for efficient edge and mobile computing.
UR - http://www.scopus.com/inward/record.url?scp=85130468864&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85130468864&partnerID=8YFLogxK
U2 - 10.1109/VLSI-DAT54769.2022.9768055
DO - 10.1109/VLSI-DAT54769.2022.9768055
M3 - Conference contribution
AN - SCOPUS:85130468864
T3 - 2022 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2022 - Proceedings
BT - 2022 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2022 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2022 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2022
Y2 - 18 April 2022 through 21 April 2022
ER -