Virtual-metrology-based FDC scheme

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Most conventional fault-detection-and-classification (FDC) approaches are to find out the target devices (TDs) required for monitoring and the TDs' related key parameters needed to be monitored, and then by applying the statistical-process-control (SPC) approach to detect the faults. However, in practical situation, an abnormal key-parameter value may not be solely caused by its own TD; instead, it may also be resulted from the other related parameters. As a result, accurate fault classification or diagnosis may not be achieved. The purpose of this paper is to propose a virtual-metrology-based baseline FDC scheme that includes the TD baseline model and FDC logic. By applying this baseline FDC scheme, fault diagnosis can then be accomplished.

Original languageEnglish
Title of host publication2012 IEEE International Conference on Automation Science and Engineering
Subtitle of host publicationGreen Automation Toward a Sustainable Society, CASE 2012
Pages80-85
Number of pages6
DOIs
Publication statusPublished - 2012 Dec 1
Event2012 IEEE International Conference on Automation Science and Engineering: Green Automation Toward a Sustainable Society, CASE 2012 - Seoul, Korea, Republic of
Duration: 2012 Aug 202012 Aug 24

Publication series

NameIEEE International Conference on Automation Science and Engineering
ISSN (Print)2161-8070
ISSN (Electronic)2161-8089

Other

Other2012 IEEE International Conference on Automation Science and Engineering: Green Automation Toward a Sustainable Society, CASE 2012
CountryKorea, Republic of
CitySeoul
Period12-08-2012-08-24

All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Virtual-metrology-based FDC scheme'. Together they form a unique fingerprint.

Cite this