Virtual-metrology-based FDC scheme

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Most conventional fault-detection-and-classification (FDC) approaches are to find out the target devices (TDs) required for monitoring and the TDs' related key parameters needed to be monitored, and then by applying the statistical-process-control (SPC) approach to detect the faults. However, in practical situation, an abnormal key-parameter value may not be solely caused by its own TD; instead, it may also be resulted from the other related parameters. As a result, accurate fault classification or diagnosis may not be achieved. The purpose of this paper is to propose a virtual-metrology-based baseline FDC scheme that includes the TD baseline model and FDC logic. By applying this baseline FDC scheme, fault diagnosis can then be accomplished.

Original languageEnglish
Title of host publication2012 IEEE International Conference on Automation Science and Engineering
Subtitle of host publicationGreen Automation Toward a Sustainable Society, CASE 2012
Pages80-85
Number of pages6
DOIs
Publication statusPublished - 2012 Dec 1
Event2012 IEEE International Conference on Automation Science and Engineering: Green Automation Toward a Sustainable Society, CASE 2012 - Seoul, Korea, Republic of
Duration: 2012 Aug 202012 Aug 24

Publication series

NameIEEE International Conference on Automation Science and Engineering
ISSN (Print)2161-8070
ISSN (Electronic)2161-8089

Other

Other2012 IEEE International Conference on Automation Science and Engineering: Green Automation Toward a Sustainable Society, CASE 2012
CountryKorea, Republic of
CitySeoul
Period12-08-2012-08-24

Fingerprint

Fault detection
Statistical process control
Failure analysis
Monitoring

All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

Cite this

Hsieh, Y. S., Cheng, F. T., & Yang, H. C. (2012). Virtual-metrology-based FDC scheme. In 2012 IEEE International Conference on Automation Science and Engineering: Green Automation Toward a Sustainable Society, CASE 2012 (pp. 80-85). [6386371] (IEEE International Conference on Automation Science and Engineering). https://doi.org/10.1109/CoASE.2012.6386371
Hsieh, Yao Sheng ; Cheng, Fan Tien ; Yang, Haw Ching. / Virtual-metrology-based FDC scheme. 2012 IEEE International Conference on Automation Science and Engineering: Green Automation Toward a Sustainable Society, CASE 2012. 2012. pp. 80-85 (IEEE International Conference on Automation Science and Engineering).
@inproceedings{2c73b3a2be1b472ebff7502d97179a7f,
title = "Virtual-metrology-based FDC scheme",
abstract = "Most conventional fault-detection-and-classification (FDC) approaches are to find out the target devices (TDs) required for monitoring and the TDs' related key parameters needed to be monitored, and then by applying the statistical-process-control (SPC) approach to detect the faults. However, in practical situation, an abnormal key-parameter value may not be solely caused by its own TD; instead, it may also be resulted from the other related parameters. As a result, accurate fault classification or diagnosis may not be achieved. The purpose of this paper is to propose a virtual-metrology-based baseline FDC scheme that includes the TD baseline model and FDC logic. By applying this baseline FDC scheme, fault diagnosis can then be accomplished.",
author = "Hsieh, {Yao Sheng} and Cheng, {Fan Tien} and Yang, {Haw Ching}",
year = "2012",
month = "12",
day = "1",
doi = "10.1109/CoASE.2012.6386371",
language = "English",
isbn = "9781467304283",
series = "IEEE International Conference on Automation Science and Engineering",
pages = "80--85",
booktitle = "2012 IEEE International Conference on Automation Science and Engineering",

}

Hsieh, YS, Cheng, FT & Yang, HC 2012, Virtual-metrology-based FDC scheme. in 2012 IEEE International Conference on Automation Science and Engineering: Green Automation Toward a Sustainable Society, CASE 2012., 6386371, IEEE International Conference on Automation Science and Engineering, pp. 80-85, 2012 IEEE International Conference on Automation Science and Engineering: Green Automation Toward a Sustainable Society, CASE 2012, Seoul, Korea, Republic of, 12-08-20. https://doi.org/10.1109/CoASE.2012.6386371

Virtual-metrology-based FDC scheme. / Hsieh, Yao Sheng; Cheng, Fan Tien; Yang, Haw Ching.

2012 IEEE International Conference on Automation Science and Engineering: Green Automation Toward a Sustainable Society, CASE 2012. 2012. p. 80-85 6386371 (IEEE International Conference on Automation Science and Engineering).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Virtual-metrology-based FDC scheme

AU - Hsieh, Yao Sheng

AU - Cheng, Fan Tien

AU - Yang, Haw Ching

PY - 2012/12/1

Y1 - 2012/12/1

N2 - Most conventional fault-detection-and-classification (FDC) approaches are to find out the target devices (TDs) required for monitoring and the TDs' related key parameters needed to be monitored, and then by applying the statistical-process-control (SPC) approach to detect the faults. However, in practical situation, an abnormal key-parameter value may not be solely caused by its own TD; instead, it may also be resulted from the other related parameters. As a result, accurate fault classification or diagnosis may not be achieved. The purpose of this paper is to propose a virtual-metrology-based baseline FDC scheme that includes the TD baseline model and FDC logic. By applying this baseline FDC scheme, fault diagnosis can then be accomplished.

AB - Most conventional fault-detection-and-classification (FDC) approaches are to find out the target devices (TDs) required for monitoring and the TDs' related key parameters needed to be monitored, and then by applying the statistical-process-control (SPC) approach to detect the faults. However, in practical situation, an abnormal key-parameter value may not be solely caused by its own TD; instead, it may also be resulted from the other related parameters. As a result, accurate fault classification or diagnosis may not be achieved. The purpose of this paper is to propose a virtual-metrology-based baseline FDC scheme that includes the TD baseline model and FDC logic. By applying this baseline FDC scheme, fault diagnosis can then be accomplished.

UR - http://www.scopus.com/inward/record.url?scp=84872551716&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84872551716&partnerID=8YFLogxK

U2 - 10.1109/CoASE.2012.6386371

DO - 10.1109/CoASE.2012.6386371

M3 - Conference contribution

AN - SCOPUS:84872551716

SN - 9781467304283

T3 - IEEE International Conference on Automation Science and Engineering

SP - 80

EP - 85

BT - 2012 IEEE International Conference on Automation Science and Engineering

ER -

Hsieh YS, Cheng FT, Yang HC. Virtual-metrology-based FDC scheme. In 2012 IEEE International Conference on Automation Science and Engineering: Green Automation Toward a Sustainable Society, CASE 2012. 2012. p. 80-85. 6386371. (IEEE International Conference on Automation Science and Engineering). https://doi.org/10.1109/CoASE.2012.6386371