Abstract
Most conventional fault-detection-and-classification (FDC) approaches are to find out the target devices (TDs) required for monitoring and the TDs' related key parameters needed to be monitored, and then by applying the statistical-process-control (SPC) approach to detect the faults. However, in practical situation, an abnormal key-parameter value may not be solely caused by its own TD; instead, it may also be resulted from the other related parameters. As a result, accurate fault classification or diagnosis may not be achieved. The purpose of this paper is to propose a virtual-metrology-based baseline FDC scheme that includes the TD baseline model and FDC logic. By applying this baseline FDC scheme, fault diagnosis can then be accomplished.
| Original language | English |
|---|---|
| Title of host publication | 2012 IEEE International Conference on Automation Science and Engineering |
| Subtitle of host publication | Green Automation Toward a Sustainable Society, CASE 2012 |
| Pages | 80-85 |
| Number of pages | 6 |
| DOIs | |
| Publication status | Published - 2012 Dec 1 |
| Event | 2012 IEEE International Conference on Automation Science and Engineering: Green Automation Toward a Sustainable Society, CASE 2012 - Seoul, Korea, Republic of Duration: 2012 Aug 20 → 2012 Aug 24 |
Publication series
| Name | IEEE International Conference on Automation Science and Engineering |
|---|---|
| ISSN (Print) | 2161-8070 |
| ISSN (Electronic) | 2161-8089 |
Other
| Other | 2012 IEEE International Conference on Automation Science and Engineering: Green Automation Toward a Sustainable Society, CASE 2012 |
|---|---|
| Country | Korea, Republic of |
| City | Seoul |
| Period | 12-08-20 → 12-08-24 |
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All Science Journal Classification (ASJC) codes
- Control and Systems Engineering
- Electrical and Electronic Engineering
Cite this
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Virtual-metrology-based FDC scheme. / Hsieh, Yao Sheng; Cheng, Fan Tien; Yang, Haw Ching.
2012 IEEE International Conference on Automation Science and Engineering: Green Automation Toward a Sustainable Society, CASE 2012. 2012. p. 80-85 6386371 (IEEE International Conference on Automation Science and Engineering).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
TY - GEN
T1 - Virtual-metrology-based FDC scheme
AU - Hsieh, Yao Sheng
AU - Cheng, Fan Tien
AU - Yang, Haw Ching
PY - 2012/12/1
Y1 - 2012/12/1
N2 - Most conventional fault-detection-and-classification (FDC) approaches are to find out the target devices (TDs) required for monitoring and the TDs' related key parameters needed to be monitored, and then by applying the statistical-process-control (SPC) approach to detect the faults. However, in practical situation, an abnormal key-parameter value may not be solely caused by its own TD; instead, it may also be resulted from the other related parameters. As a result, accurate fault classification or diagnosis may not be achieved. The purpose of this paper is to propose a virtual-metrology-based baseline FDC scheme that includes the TD baseline model and FDC logic. By applying this baseline FDC scheme, fault diagnosis can then be accomplished.
AB - Most conventional fault-detection-and-classification (FDC) approaches are to find out the target devices (TDs) required for monitoring and the TDs' related key parameters needed to be monitored, and then by applying the statistical-process-control (SPC) approach to detect the faults. However, in practical situation, an abnormal key-parameter value may not be solely caused by its own TD; instead, it may also be resulted from the other related parameters. As a result, accurate fault classification or diagnosis may not be achieved. The purpose of this paper is to propose a virtual-metrology-based baseline FDC scheme that includes the TD baseline model and FDC logic. By applying this baseline FDC scheme, fault diagnosis can then be accomplished.
UR - http://www.scopus.com/inward/record.url?scp=84872551716&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84872551716&partnerID=8YFLogxK
U2 - 10.1109/CoASE.2012.6386371
DO - 10.1109/CoASE.2012.6386371
M3 - Conference contribution
AN - SCOPUS:84872551716
SN - 9781467304283
T3 - IEEE International Conference on Automation Science and Engineering
SP - 80
EP - 85
BT - 2012 IEEE International Conference on Automation Science and Engineering
ER -